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ST72F521 数据表(PDF) 177 Page - STMicroelectronics |
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ST72F521 数据表(HTML) 177 Page - STMicroelectronics |
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177 / 215 page ![]() ST72F521, ST72521B 177/215 CLOCK CHARACTERISTICS (Cont’d) 12.5.5 PLL Characteristics Note: 1. Data characterized but not tested. The user must take the PLL jitter into account in the application (for example in serial communication or sampling of high frequency signals). The PLL jitter is a periodic effect, which is integrated over several CPU cycles. Therefore the longer the period of the application signal, the less it will be impacted by the PLL jitter. Figure 94 shows the PLL jitter integrated on application signals in the range 125kHz to 4MHz. At frequen- cies of less than 125KHz, the jitter is negligible. Figure 94. Integrated PLL Jitter vs signal frequency1 Note 1: Measurement conditions: fCPU = 8MHz. Symbol Parameter Conditions Min Typ Max Unit fOSC PLL input frequency range 2 4 MHz ∆ fCPU/ fCPU Instantaneous PLL jitter 1) ROM device, fOSC = 4 MHz. 0.7 2 % Flash device, fOSC = 4 MHz. 1.0 2.5 Flash device, fOSC = 2 MHz. 2.5 4.0 0 0.2 0.4 0.6 0.8 1 1.2 4 MHz 2 MHz 1 MHz 500 kHz 250 kHz 125 kHz Application Frequency +/-Jitter (%) FLASH typ ROM max ROM typ |
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