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Beehive Electronics · Tel: (707) 824-9206 · info@beehive-electronics.com

rev. 2.2

8555 Lawrence Lane, Sebastopol CA 95472

100 Series EMC Probes

Description

The 100 series EMC probes are designed for identifying and fixing EMC problems. The

100A, 100B, and 100C are loop probes, and are sensitive to magnetic fields. The 100D is

a stub probe, and is sensitive to electric fields.

The loop probes have integrated electrostatic shields, providing isolation from common-

mode signals. As a result, these probes deliver excellent repeatability. The different loop

sizes allow the user to select the optimum probe for a given frequency, providing the

optimum sensitivity and spatial resolution.

The 100D stub probe, with its narrow tip, offers the highest spatial resolution. It is

ideally suited to tasks such as tracking EMC sources down to the individual pins of an IC.

Because of the planar construction of the probes, even the large loops are only 0.11”

thick, allowing the probe to be inserted into narrow seams and gaps.