LT MVSG

19 Version 1.0 | 2020-03-30

Glossary

1)

Brightness: Brightness values are measured during a current pulse of typically 25 ms, with an internal

reproducibility of ±8 % and an expanded uncertainty of ±11 % (acc. to GUM with a coverage factor of

k = 3).

2)

Reverse Operation: Reverse Operation of 10 hours is permissible in total. Continuous reverse opera-

tion is not allowed.

3)

Wavelength: The wavelength is measured at a current pulse of typically 25 ms, with an internal repro-

ducibility of ±0.5 nm and an expanded uncertainty of ±1 nm (acc. to GUM with a coverage factor of k =

3).

4)

Forward Voltage: The forward voltage is measured during a current pulse of typically 8 ms, with an

internal reproducibility of ±0.05 V and an expanded uncertainty of ±0.1 V (acc. to GUM with a coverage

factor of k = 3).

5)

Thermal Resistance: Rth max is based on statistic values (6σ).

6)

Typical Values: Due to the special conditions of the manufacturing processes of semiconductor devic-

es, the typical data or calculated correlations of technical parameters can only reflect statistical figures.

These do not necessarily correspond to the actual parameters of each single product, which could dif-

fer from the typical data and calculated correlations or the typical characteristic line. If requested, e.g.

because of technical improvements, these typ. data will be changed without any further notice.

7)

Characteristic curve: In the range where the line of the graph is broken, you must expect higher differ-

ences between single devices within one packing unit.

8)

Tolerance of Measure: Unless otherwise noted in drawing, tolerances are specified with ±0.1 and

dimensions are specified in mm.

9)

Tape and Reel: All dimensions and tolerances are specified acc. IEC 60286-3 and specified in mm.