CD54ACT20, CD74ACT20

DUAL 4-INPUT POSITIVE-NAND GATES

SCHS320 – NOVEMBER 2002

1

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

D Inputs Are TTL-Voltage Compatible

D Speed of Bipolar F, AS, and S, With

Significantly Reduced Power Consumption

D Balanced Propagation Delays

D ±24-mA Output Drive Current

– Fanout to 15 F Devices

D SCR-Latchup-Resistant CMOS Process and

Circuit Design

D Exceeds 2-kV ESD Protection Per

MIL-STD-883, Method 3015

description/ordering information

The ’ACT20 devices contain two independent 4-input NAND gates. They perform the Boolean function

Y = A

• B • C • D or Y = A + B + C + D in positive logic.

ORDERING INFORMATION

TA

PACKAGE†

ORDERABLE

PART NUMBER

TOP-SIDE

MARKING

PDIP – E

Tube

CD74ACT20E

CD74ACT20E

55

°Cto125°C

SOIC

M

Tube

CD74ACT20M

ACT20M

–55

°C to 125°C

SOIC – M

Tape and reel

CD74ACT20M96

ACT20M

CDIP – F

Tube

CD54ACT20F3A

CD54ACT20F3A

† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines

are available at www.ti.com/sc/package.

FUNCTION TABLE

(each gate)

INPUTS

OUTPUT

A

B

C

D

Y

H

H

H

H

L

L

XX

X

H

X

LX

X

H

X

XL

X

H

X

X

X

L

H

logic diagram (positive logic)

1A

1Y

1B

1C

1D

2A

2Y

2B

2C

2D

1

2

4

5

9

10

12

13

68

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

NC

1C

1D

1Y

GND

VCC

2D

2C

NC

2B

2A

2Y

CD54ACT20 ...F PACKAGE

CD74ACT20 ...E OR M PACKAGE

(TOP VIEW)

Copyright

 2002, Texas Instruments Incorporated

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.