LMP2012QML

SNOSAU5H – MARCH 2007 – REVISED APRIL 2013

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ELDRS-FREE PRODUCTS

ELDRS-Free products are tested and qualified on a wafer level basis at a dose rate of 10 mrad(Si)/s per MIL-

STD-883G, Test Method 1019.7, Condition D. Wafer level low dose rate test data are available with lot

shipments.

SINGLE EVENT UPSET

A report on single event upset (SEU) is available upon request.

Revision History

Date Released

Revision

Section

Changes

03/19/07

A

Initial Release

Initial Release

10/17/08

B

Electrical Section

Added typical parameters to 2.7V and 5V AC

Electrical Sections. Revision A will be Archived.

07/13/09

C

2.7V DC and 5V DC Electrical Section

Added typical parameter TCVOS to 2.7V DC and 5V

DC Electrical Section. Revision B will be Archived.

12/08/09

D

Features, Ordering Information and Notes

Reference to ELDRS, New ELDRS part number and

added ELDRS Note 6. Revision C will be Archived.

06/08/2010

E

General Description, 2.7V DC and 5V DC

Removed first line. Added Delta Table to Electrical's

Electrical Section added New Radiation

to match what is in the SMD and New Radiation

Section.

Section. Revision D will be Archived.

11/30/2010

F

AC Electrical 5V parameter table conditions

Correct typo to unless otherwise specified parameters

From: V+ = 2.7V, V -= 0V, VCM = 1.35V, VO = 1.35V,

and RL > 1 MΩ. To: V

+ = 5V, V -= 0V, V

CM = 2.5V, VO

= 2.5V, and RL > 1 MΩ. Revision E will be Archived.

04/02/2013

H

All

Changed layout of National Data Sheet to TI format

12

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