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SN74AHC123AMDREP 数据表(PDF) 1 Page - Texas Instruments

部件名 SN74AHC123AMDREP
功能描述  DUAL RETRIGGERABLE MONOSTABLE MULTIVIBRATOR
PDF  17 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

SN74AHC123AMDREP 数据表(HTML) 1 Page - Texas Instruments

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FEATURES
DPACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
1A
1B
1CLR
1Q
2Q
2C
ext
2R
/C
ext
ext
GND
V
CC
1R
/C
ext
ext
1C
ext
1Q
2Q
2CLR
2B
2A
DESCRIPTION/ORDERING INFORMATION
SN74AHC123A-EP
DUAL RETRIGGERABLE MONOSTABLE MULTIVIBRATOR
SCLS703A – JULY 2006 – REVISED MARCH 2007
• Controlled Baseline
• Overriding Clear Terminates Output Pulse
One Assembly Site
• Glitch-Free Power-Up Reset On Outputs
One Test Site
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
One Fabrication Site
• ESD Protection Exceeds JESD 22
• Extended Temperature Performance of –55°C
to 125
°C
2000-V Human-Body Model (A114-A)
• Enhanced Diminishing Manufacturing Sources
200-V Machine Model (A115-A)
(DMS) Support
1000-V Charged-Device Model (C101)
• Enhanced Product-Change Notification
xxx
• Qualification Pedigree (1)
• Operating Range 2-V to 5.5-V V
CC
• Schmitt-Trigger Circuitry On A, B, and CLR
Inputs for Slow Input Transition Rates
• Edge Triggered From Active-High or
Active-Low Gated Logic Inputs
• Retriggerable for Long Output Pulses
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
xxx
performance and environmental limits.
The SN74AHC123A device is a dual retriggerable monostable multivibrator designed for 2-V to 5.5-V VCC
operation.
This edge-triggered multivibrator features output pulse-duration control by three methods. In the first method, the
A input is low, and the B input goes high. In the second method, the B input is high, and the A input goes low. In
the third method, the A input is low, the B input is high, and the clear (CLR) input goes high.
The output pulse duration is programmed by selecting external resistance and capacitance values. The external
timing capacitor must be connected between Cext and Rext/Cext (positive) and an external resistor connected
between Rext/Cext and VCC. To obtain variable pulse durations, connect an external variable resistance between
Rext/Cext and VCC. The output pulse duration can be reduced by taking CLR low.
Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input
pulse. The A, B, and CLR inputs have Schmitt triggers with sufficient hysteresis to handle slow input transition
rates with jitter-free triggering at the outputs.
Once triggered, the basic pulse duration can be extended by retriggering the gated low-level-active (A) or
high-level-active (B) input. Pulse duration can be reduced by taking CLR low. CLR can be used to override A or
B inputs. The input/output timing diagram illustrates pulse control by retriggering the inputs and early clearing.
The variance in output pulse duration from device to device is less than
±0.5% (typ) for given external timing
components. An example of this distribution for the SN74AHC123A is shown in Figure 10. Variations in output
pulse duration versus supply voltage and temperature are shown in Figure 6.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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