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TLV2556MPWREP 数据表(PDF) 8 Page - Texas Instruments |
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TLV2556MPWREP 数据表(HTML) 8 Page - Texas Instruments |
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8 / 40 page ![]() TIMING CHARACTERISTICS (1) TLV2556-EP SLAS598A – NOVEMBER 2008 – REVISED JULY 2009 ................................................................................................................................................... www.ti.com operating characteristics, VREF+ = 5 V, SCLK frequency = 15 MHz, VCC = 5 V, load = 25 pF, TA= -40°C to 85°C (unless otherwise noted) PARAMETER MIN TYP MAX UNIT tw1 Pulse duration I/O CLOCK high or low 26.7 100000 ns tsu1 Setup time DATA IN valid before I/O CLOCK rising edge (see Figure 38) 12 ns th1 Hold time DATA IN valid after I/O CLOCK rising edge (see Figure 38) 0 ns tsu2 Setup time CS low before 1st rising I/O CLOCK edge(2) (see Figure 39) 25 ns th2 Hold time CS pulse duration high time (see Figure 39) 100 ns th3 Hold time CS low after last I/O CLOCK falling edge (see Figure 39) 0 ns th4 Hold time DATA OUT valid after I/O CLOCK falling edge (see Figure 40) 2 ns th5 Hold time CS high after EOC rising edge when CS is toggled (see Figure 43) 0 ns th6 Hold time CS high after INT falling edge (see Figure 43) 0 ns Hold time I/O CLOCK low after EOC rising edge or INT falling edge when CS is held th7 10 ns low (see Figure 44) Load = 25 pF 28 Delay time CS falling edge to DATA OUT valid td1 ns (MSB or LSB) (see Figure 37) Load = 10 pF 20 td2 Delay time CS rising edge to DATA OUT high impedance (see Figure 37) 10 ns td3 Delay time I/O CLOCK falling edge to next DATA OUT bit valid (see Figure 40) 2 20 ns td4 Delay time last I/O CLOCK falling edge to EOC falling edge (see Figure 41) 55 ns td5 Delay time last I/O CLOCK falling edge to CS falling edge to abort conversion 1.5 µs td6 Delay time last I/O CLOCK falling edge to INT falling edge (see Figure 41) MAX(tconv) ns Delay time EOC rising edge or INT falling edge to DATA OUT valid: MSB or LSB first td7 4 ns (see Figure 42) td9 Delay time I/O CLOCK high to INT rising edge when CS is held low (see Figure 44) 1 28 ns tt1 Transition time I/O CLOCK(2) (see Figure 40) 1 µs tt2 Transition time DATA OUT (see Figure 40) 5 ns tt3 Transition time INT/EOC, CL = 7 pF (see Figure 41 and Figure 42) 2.4 ns tt4 Transition time DATA IN, CS 10 µs MAX(tconv) + tcyc Total cycle time (sample, conversion and delays)(2) I/O period µs (8/12/16 CLKs) Source impedance = 25 Ω 600 Source impedance = 100 Ω 650 tsample Channel acquisition time (sample), at 1 k Ω(2) ns Source impedance = 500 Ω 700 Source impedance = 1 k Ω 1000 (1) Timing parameters are not production tested. (2) I/O CLOCK period = 8x [1/(I/O CLOCK frequency)] or 12x [1/(I/O CLOCK frequency)] or 16x [1/(I/O CLOCK frequency)] depends on I/O format selected. 8 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TLV2556-EP |
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