LM57

TRIP TEST

GND

TOVER

VDD

TOVER

LM57

TRIP TEST

GND

TOVER

VDD

100k

TOVER

LM57

GND

VDD

Asserts when TDIE > TTRIP

See text

100k

TOVER

TRIP TEST

SENSE1

SENSE2

LM57-Q1

SNIS191A – JULY 2015 – REVISED JULY 2015

www.ti.com

Device Functional Modes (continued)

Figure 16. Temperature Switch Using Open-Drain Output

As shown in Figure 17 the LM57-Q1 has a TRIP Test input simplifying in situ board conductivity testing. Forcing

TRIP TEST pin "HIGH" will drive the TOVER pin "LOW" and the TOVER pin "HIGH".

Figure 17. Trip Test Digital Output Test Circuit

In the circuit shown in Figure 18 when TOVER goes active high, it drives trip test high. Trip test high causes TOVER

to stay high. It is therefore latched. To release the latch, power down, then power up. The LM57-Q1 always

comes up in a released condition.

Figure 18. Simple Latch Circuit

24

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Product Folder Links: LM57-Q1