AR0130CS datasheet(21/40 Pages) ONSEMI

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AR0130CS

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Row−wise Noise Correction

Row (Line)−wise Noise Correction is handled

automatically by the image sensor. No adjustments are

provided except to enable or disable this feature. Clearing

R0x3044[10] disables the row noise correction. Default

setting is for row noise correction to be enabled.

Row−wise noise correction is performed by calculating an

average from a set of optically black pixels at the start of

each line and then applying each average to all the active

pixels of the line.

Column Correction

The AR0130 uses column parallel readout architecture to

achieve fast frame rate. Without any corrections, the

consequence of this architecture is that different column

signal paths have slightly different offsets that might show

up on the final image as structured fixed pattern noise.

AR0130 has column correction circuitry that measures

this offset and removes it from the image before output. This

is done by sampling dark rows containing tied pixels and

measuring an offset coefficient per column to be corrected

later in the signal path.

Column correction can be enabled/disabled via

R0x30D4[15]. Additionally, the number of rows used for

this offset coefficient measurement is set in R0x30D4[3:0].

By default this register is set to 0x7, which means that 8 rows

are used. This is the recommended value. Other control

features regarding column correction can be viewed in the

AR0130 Register reference. Any changes to column

correction settings need to be done when the sensor

streaming is disabled and the appropriate triggering

sequence must be followed as described below.

Column Correction Triggering

Column correction requires a special procedure to trigger

depending on which state the sensor is in.

Column Triggering on Startup

When streaming the sensor for the first time after

power−up, a special sequence needs to be followed to make

sure that the column correction coefficients are internally

calculated properly.

1. Follow proper power up sequence for power

supplies and clocks

2. Apply sequencer settings if needed

3. Apply frame timing and PLL settings as required

by application

4. Set analog gain to 1x and low conversion gain

5. Enable column correction and settings

6. Disable auto re−trigger for change in conversion

gain or col_gain, and enable column correction

always. (R0x30BA = 0x0008).

7. Enable streaming (R0x301A[2] = 1) or drive the

TRIGGER pin HIGH.

8. Wait 9 frames to settle. (First frame after coming

up from standby is internally column correction

disabled.)

9. Disable streaming (R0x301A[2] = 0) or drive the

TRIGGER pin LOW.

After this, the sensor has calculated the proper column

correction coefficients and the sensor is ready for streaming.

Any other settings (including gain, integration time and

conversion gain etc.) can be done afterwards without

affecting column correction.

Column Correction Retriggering Due to Mode Change

Since column offsets is sensitive to changes in the analog

signal path, such changes require column correction

circuitry to be retriggered for the new path. Examples of

such mode changes include: horizontal mirror, vertical

mirror, changes to column correction settings.

When such changes take place, the following sequence

needs to take place:

1. Disable streaming (R0x301A[2]=0) or drive the

TRIGGER pin LOW.

2. Enable streaming (R0x301A[2]=1) or drive the

TRIGGER pin HIGH.

3. Wait 9 frames to settle.

NOTE: The above steps are not needed if the sensor is

being reset (soft or hard reset) upon the mode

change.

Test Patterns

The AR0130 has the capability of injecting a number of

test patterns into the top of the datapath to debug the digital

logic. With one of the test patterns activated, any of the

datapath functions can be enabled to exercise it in a

deterministic fashion. Test patterns are selected by

Test_Pattern_Mode register (R0x3070). Only one of the test

patterns can be enabled at a given point in time by setting the

Test_Pattern_Mode register according to Table 7. When test

patterns are enabled the active area will receive the value

specified by the selected test pattern and the dark pixels will

receive the value in Test_Pattern_Green (R0x3074 and

R0x3078) for green pixels, Test_Pattern_Blue (R0x3076)

for blue pixels, and Test_Pattern_Red (R0x3072) for red

pixels.

NOTE: Turn off black level calibration (BLC) when

Test Pattern is enabled.

Table 7. TEST PATTERN MODES

Test_Pattern_Mode

Test Pattern Output

No test pattern (normal operation)

Solid color test pattern

100% color bar test pattern

Fade−to−gray color bar test pattern

256

Walking 1s test pattern (12−bit)

Color Field

When the color field mode is selected, the value for each

pixel is determined by its color. Green pixels will receive the

value in Test_Pattern_Green, red pixels will receive the

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