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STPS640CB 数据表(PDF) 4 Page - STMicroelectronics |
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STPS640CB 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 9 page ![]() Characteristics STPS640C 4/9 Figure 7. Relative variation of thermal transient impedance junction to case versus pulse duration (TO-220AB/DPAK) Figure 8. Relative variation of thermal impedance junction to case versus pulse duration (TO-220FPAB) 1E-3 1E-2 1E-1 1E+0 0.0 0.2 0.4 0.6 0.8 1.0 Z/R th(j-c) th(j-c) T δ=tp/T tp t (s) p δ = 0.5 δ = 0.2 δ = 0.1 Single pulse 1E-3 1E-2 1E-1 1E+0 1E+1 0.0 0.2 0.4 0.6 0.8 1.0 Z/R th(j-c) th(j-c) T δ=tp/T tp t (s) p δ = 0.5 δ = 0.2 δ = 0.1 Single pulse Figure 9. Reverse leakage current versus reverse voltage applied (typical values, per diode) Figure 10. Junction capacitance versus reverse voltage applied (typical values, per diode) Figure 11. Forward voltage drop versus forward current (maximum values, per diode) Figure 12. Thermal resistance junction to ambient versus copper surface under tab (Epoxy printed circuit board FR4, copper thickness: 35 µm) 0 5 10 15 20 25 30 35 40 1E-5 1E-4 1E-3 1E-2 I (A) R V (V) R T =125°C j T =150°C j T =100°C j T =75°C j 12 5 10 20 50 10 100 500 C(pF) V (V) R F=1MHz V =30mV T =25°C OSC RMS j 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0.1 1.0 10.0 I (A) FM V (V) FM T =25°C j T =150°C (typical values) j 0 4 8 12 16 20 24 28 32 36 40 0 10 20 30 40 50 60 70 80 R (°C/W) th(j-a) S(Cu)(cm²) |
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