5 Specifications

5.1 Absolute Maximum Ratings, TL331-Q1, TL331E-Q1

over operating free-air temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

VCC

Supply voltage(2)

0

36

V

VID

Differential input voltage(3)

–36

36

V

VI

Input voltage range (either input)

–0.3

36

V

VO

Output voltage

0

36

V

IO

Output current

0

20

mA

Duration of output short-circuit to ground(4)

Unlimited

TJ

Operating virtual junction temperature

150

°C

Tstg

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings can cause permanent damage to the device. These are stress

ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated

under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods can affect device

reliability.

(2)

All voltage values, except differential voltages, are with respect to the network ground.

(3)

Differential voltages are at IN+ with respect to IN–.

(4)

Short circuits from outputs to VCC can cause excessive heating and eventual destruction.

5.2 Absolute Maximum Ratings, TL331B-Q1 and TL391B-Q1

over operating free-air temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

VCC

Supply voltage(2)

-0.3

38

V

VID

Differential input voltage(3)

–38

38

V

VI

Input voltage range (either input)

–0.3

38

V

VO

Output voltage

-0.3

38

V

IO

Output current

20

mA

Duration of output short-circuit to ground(4)

Unlimited

IIK

Input current(5)

–50

mA

TJ

Operating virtual junction temperature

–40

150

°C

Tstg

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings can cause permanent damage to the device. These are stress

ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated

under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods can affect device

reliability.

(2)

All voltage values, except differential voltages, are with respect to the network ground.

(3)

Differential voltages are at IN+ with respect to IN–.

(4)

Short circuits from outputs to VCC can cause excessive heating and eventual destruction.

(5)

Input current flows thorough parasitic diode to ground and can turn on parasitic transistors that can increase ICC and can cause output

to be incorrect. Normal operation resumes when input current is removed.

5.3 ESD Ratings, All Devices

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human-body model (HBM), per AEC Q100-002(1)

±2000

V

Charged-device model (CDM), per AEC Q100-0111

±750

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

TL331-Q1, TL331B-Q1, TL391B-Q1

SLVS969H – OCTOBER 2009 – REVISED JANUARY 2025

www.ti.com

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