ADS5240

www.ti.com ...................................................................................................................................................... SBAS326E – JUNE 2004 – REVISED JANUARY 2009

Revision History

Changes from Revision D (September 2005) to Revision E .......................................................................................... Page

• Updated Absolute Maximum Ratings table: added entries for Digital Input Pins, Set 1 and Set 2 and added footnote 3.... 2

Changes from Revision C (December 2004) to Revision D ........................................................................................... Page

• Changed component image to have TI logo.......................................................................................................................... 1

• Changed fourth bullet in Features section............................................................................................................................. 1

• Changed 12th bullet of Features section............................................................................................................................... 1

• Added fifth bullet to Applications section. .............................................................................................................................. 1

• Changed front page figure. .................................................................................................................................................... 1

• Changed first footnote of Ordering Information table. ........................................................................................................... 2

• Changed Absolute Maximum Ratings table and footnotes.................................................................................................... 2

• Changed Recommended Operating Conditions table and footnotes. ................................................................................... 3

• Changed Electrical Characteristics table, conditions, and footnotes..................................................................................... 4

• Changed Reference Selection table; moved from page 3..................................................................................................... 5

• Changed AC Characteristics conditions. ............................................................................................................................... 6

• Changed ENOB, Crosstalk, and IMD rows of AC Characteristics table................................................................................ 6

• Changed LVDS table. ............................................................................................................................................................ 7

• Changed Switching Characteristics table. ............................................................................................................................. 7

• Changed LVDS timing diagram. ............................................................................................................................................ 8

• Changed Reset timing diagram. ............................................................................................................................................ 8

• Changed Power-Down timing diagram. ................................................................................................................................. 9

• Deleted Serial Interface table. ............................................................................................................................................... 9

• Changed LVDS timing diagram. ............................................................................................................................................ 9

• Changed Serial Interface timing diagram and table. ............................................................................................................. 9

• Changed Serial Interface Registers table. ........................................................................................................................... 10

• Changed Test Patterns table. .............................................................................................................................................. 10

• Changed Aperture Delay, Clock Duty Cycle, ENOB, SINAD, SNR, SFDR, and IMD3 sections of Definitions of

Specifications section. ......................................................................................................................................................... 13

• Deleted Nyquist Sampling, Offset Error, Propagation Delay, Temperature Drift, and THD sections of Definition of

Specification section. ........................................................................................................................................................... 13

• Changed Figure 1. ............................................................................................................................................................... 14

• Changed Figure 2. ............................................................................................................................................................... 14

• Changed Figure 3. ............................................................................................................................................................... 14

• Changed Figure 4. ............................................................................................................................................................... 14

• Changed Figure 9. ............................................................................................................................................................... 15

• Deleted Figure 12 (Power Dissipation vs Temperature)...................................................................................................... 15

• Changed 2V to 1.95V, 1V to 0.95V, and 1.5V to 1.45V in first paragraph of Overview section in Theory of operation. .... 16

• Changed first paragraph of Driving the Analog Inputs section in Theory of Operation. ...................................................... 16

• Added second paragraph of Driving the Analog Inputs section in Theory of Operation. .................................................... 16

• Changed Figure 14. ............................................................................................................................................................. 16

• Deleted second and fourth paragraphs of Driving the Analog Inputs section in Theory of Operation. ............................... 16

• Deleted Figure 15 (Input Circuitry) of Driving the Analog Inputs section in Theory of Operation. ...................................... 16

• Added fourth paragraph of Driving the Analog Inputs section in Theory of Operation........................................................ 17

• Changed Input Over-Voltage Recovery section in Theory of Operation. ............................................................................ 17

• Added Figure 15 (Overall Structure of the Sample-and-Hold Circuit). ................................................................................ 17

• Changed second sentence of first paragraph of Reference Circuit Design in Theory of Operation. .................................. 18

• Changed third paragraph of Reference Circuit Design in Theory of Operation................................................................... 18

Copyright © 2004–2009, Texas Instruments Incorporated

Submit Documentation Feedback

21

Product Folder Link(s): ADS5240