1

Typical application and test circuit

Figure 1. Typical application and test circuit

IN-

2

R2

680Ω

C2

22µF

C1 470nF

IN+

R1 22K

R6

2.7Ω

C10

100nF

3

R3 22K

-

+

MUTE

STBY

4

VM

VSTBY

10

9

IN+MUTE

MUTE

STBY

R4 22K

THERMAL

SHUTDOWN

S/C

PROTECTION

R5 10K

C3 10 µF

C4 10µF

1

STBY-GND

C5

22µF

1

7

3

14

6

15

8

-Vs

-PWVs

BOOT-

STRAP

OUT

+PWVs

+Vs

C9 100nF

C8 1000µF

-Vs

D93AU011

+Vs

C7 100nF

C6 1000µF

Note: The Boucherot cell R6, C10, normally not necessary for a stable operation it could

be needed in presence of particular load impedances at VS <±25V.

TDA7296

Typical application and test circuit

DS0179 - Rev 11

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