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CLP200M 数据表(PDF) 8 Page - STMicroelectronics |
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CLP200M 数据表(HTML) 8 Page - STMicroelectronics |
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8 / 21 page ![]() Fig. 10 : Transversal and longitudinal test topologies. Fig. 12 : Power contact test circuit. Fig. 11 : Power induction test circuit. Aor B Bor A E 15 25 0.2 µF 50 20 µF 4kv ITEM UNDER TEST A B E 15 25 0.2 µF 50 20 µF ITEM UNDER TEST 25 4kv TRANSVERSAL TEST LONGITUDINAL TEST A B R1 ITEM UNDER TEST R2 1 µF 1 µF E S2 S1 100 A B <10 ITEM UNDER TEST <10 E 600 600 3. CLP200M TESTS RESULTS ACCORDING TO CCITT K20 RECOMMENDATIONS 3.1 CCITT K20 Recommendations In respect with the CCITT recommendations, the CLP200M has to withstand three kinds of distur- bances. 3.1.1. Lightning simulation (Test 2, table 2/K20) This test shall be done in transversaland longitudi- nal modes as shown in figure 10. The test generator is the 10/700 µs with 4kV of peak voltage. 3.1.2. Power induction (Test 3a and 3b, table 2/K20) Two kinds of tests using the same circuit topology (see fig.11) are defined in the CCITT K20. Test 3a : Vac(max) = 300VRMS, R1 = R2 = 600 Ω S2 operating and test duration = 200 ms. Test 3b : Vac(max) = 300VRMS (*), R1 = R2 = 200 Ω S2 operating and test duration not defined. (*) Recommended value. 3.1.3. Power contact (Test 3, table 1/K20) This test shall be done with the test circuit of figure 12. Vac(max) = 220VRMS , with switch S in each posi- tion and duration 15 min. 3.1.4. Acceptance criteria and number of tests For the tests described in chapter3.1.1., 3.1.2. and 3.1.3. two criteria are defined : A: Equipment shall withstand the test without dam- age and shall operate properly within the specified limits. B: A fire hazard should not occur in the equipment as a result of the tests. The criteria are affected to the different tests as mentioned in the table 1. ® CLP200M 8/21 |
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