DP83867IRPAP datasheet(7/139 Pages) TI2

7 / 139 page

Table 5-1. Pin Functions (continued)

TYPE(1)

DESCRIPTION

NAME

HTQFP

VQFN

GENERAL PURPOSE I/O

GPIO_0

S, O, PD

General Purpose I/O: This signal provides a multi-function configurable I/O.

Please refer to the GPIO_MUX_CTRL register for details.

GPIO_1

S, O, PD

General Purpose I/O: This signal provides a multi-function configurable I/O.

Please refer to the GPIO_MUX_CTRL register for details.

MANAGEMENT INTERFACE

MDC

I, PD

MANAGEMENT DATA CLOCK: Synchronous clock to the MDIO serial

management input/output data. This clock can be asynchronous to the MAC

transmit and receive clocks. The maximum clock rate is 25MHz and no

minimum.

MDIO

I/O

MANAGEMENT DATA I/O: Bi-directional management instruction/data signal

that is sourced by the management station or the PHY during portions of

communication. This pin requires pullup resistor. The IEEE specified resistor

value is 1.5kΩ, but a 2.2kΩ is acceptable.

INT / PWDN

I/O, PU

INTERRUPT / POWER DOWN:

The default function of this pin is POWER DOWN.

POWER DOWN: Asserting this signal low enables the Power Down mode of

operation. In this mode, the device is in a power down state and consume

minimum power. Register access is available through the Management

Interface to configure and power up the device.

INTERRUPT: This pin can be programmed as an interrupt output instead of

a Power down input. In this mode, Interrupts is asserted low using this pin.

When operating this pin as an interrupt, the pin is an open-drain architecture.

When operating this pin as an interrupt, an external 2.2kΩ connected to the

VDDIO supply is recommended.

RESET

RESET_N

I, PU

RESET: The active low RESET initializes or re-initializes the DP83867. All

internal registers re-initialize to the default state upon assertion of RESET.

The RESET input must be held low for a minimum of 1µs.

CLOCK INTERFACE

CRYSTAL/OSCILLATOR INPUT: 25MHz oscillator or crystal input (50ppm)

CRYSTAL OUTPUT: Second terminal for 25MHz crystal. Must be left floating

if a clock oscillator is used.

CLK_OUT

CLOCK OUTPUT: Output clock

JTAG INTERFACE

JTAG_CLK

I, PU

JTAG TEST CLOCK: IEEE 1149.1 Test Clock input, primary clock source

for all test logic input and output controlled by the testing entity. Supports a

maximum clock frequency of 2.5MHz.

JTAG_TDO

JTAG TEST DATA OUTPUT: IEEE 1149.1 Test Data Output pin, the most

recent test results are scanned out of the device via TDO.

JTAG_TMS

I, PU

JTAG TEST MODE SELECT: IEEE 1149.1 Test Mode Select pin, the TMS

pin sequences the Tap Controller (16-state FSM) to select the desired test

instruction.

JTAG_TDI

I, PU

JTAG TEST DATA INPUT: IEEE 1149.1 Test Data Input pin, test data is

scanned into the device via TDI.

JTAG_TRSTN

I, PU

JTAG TEST RESET: IEEE 1149.1 Test Reset pin, active low reset provides

for asynchronous reset of the Tap Controller. This reset has no effect on the

device registers.

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DP83867IR, DP83867CR

SNLS484I – FEBRUARY 2015 – REVISED JANUARY 2025

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