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TDA7563ASMTR 数据表(PDF) 29 Page - STMicroelectronics |
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TDA7563ASMTR 数据表(HTML) 29 Page - STMicroelectronics |
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29 / 35 page ![]() DocID14407 Rev 5 29/35 TDA7563A Examples of bytes sequence 34 9 Examples of bytes sequence 1 - Turn-On diagnostic - Write operation 2 - Turn-On diagnostic - Read operation The delay from 1 to 2 can be selected by software, starting from 1ms 3a - Turn-On of the power amplifier with 26dB gain, mute on, diagnostic defeat, CD = 2%. 3b - Turn-Off of the power amplifier 4 - Offset detection procedure enable 5 - Offset detection procedure stop and reading operation (the results are valid only for the offset detection bits (D2 of the bytes DB1, DB2, DB3, DB4). The purpose of this test is to check if a D.C. offset (2V typ.) is present on the outputs, produced by input capacitor with anomalous leakage current or humidity between pins. The delay from 4 to 5 can be selected by software, starting from 1ms Start Address byte with D0 = 0 ACK IB1 with D6 = 1 ACK IB2 ACK STOP Start Address byte with D0 = 1 ACK DB1 ACK DB2 ACK DB3 ACK DB4 ACK STOP Start Address byte with D0 = 0 ACK IB1 ACK IB2 ACK STOP X0000000 XXX1XX11 Start Address byte with D0 = 0 ACK IB1 ACK IB2 ACK STOP X0XXXXXX XXX0XXXX Start Address byte with D0 = 0 ACK IB1 ACK IB2 ACK STOP XX1XX11X XXX1XXXX Start Address byte with D0 = 1 ACK DB1 ACK DB2 ACK DB3 ACK DB4 ACK STOP |
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