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LP2992IM5-2.5/NOPB.A 数据表(PDF) 20 Page - Texas Instruments

部件名 LP2992IM5-2.5/NOPB.A
功能描述  LP2992 Micropower, 250mA, Low-Noise, Ultra-Low-Dropout Regulator in SOT-23 and WSON Packages Designed for Use With Very Low-ESR Output Capacitors
PDF  43 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

LP2992IM5-2.5/NOPB.A 数据表(HTML) 20 Page - Texas Instruments

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6.3.5 Output Pulldown
The new chip has an output pulldown circuit. The output pulldown activates in the following conditions:
• When the device is disabled (VON/OFF < VON/OFF(LOW))
• If 1.0V < VIN < VUVLO
Do not rely on the output pulldown circuit for discharging a large amount of output capacitance after the input
supply has collapsed because reverse current can flow from the output to the input. This reverse current flow
can cause damage to the device. See the Reverse Current section for more details.
6.3.6 Thermal Shutdown
The device contains a thermal shutdown protection circuit to disable the device when the junction temperature
(TJ) of the pass transistor rises to TSD(shutdown) (typical). Thermal shutdown hysteresis resets (turns on) the
device when the temperature falls to TSD(reset) (typical).
The thermal time-constant of the semiconductor die is fairly short, thus the device can cycle on and off
when thermal shutdown is reached until power dissipation is reduced. Power dissipation during start up can
be high from large VIN – VOUT voltage drops across the device or from high inrush currents charging large
output capacitors. Under some conditions, the thermal shutdown protection disables the device before start up
completes.
For reliable operation, limit the junction temperature to the maximum listed in the Recommended Operating
Conditions table. Operation above this maximum temperature causes the device to exceed operational
specifications. Although the internal protection circuitry of the device is designed to protect against thermal
overall conditions, this circuitry is not intended to replace proper heat sinking. Continuously running the device
into thermal shutdown or above the maximum recommended junction temperature reduces long-term reliability.
LP2992
SNVS171L – NOVEMBER 2001 – REVISED FEBRUARY 2025
www.ti.com
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Copyright © 2025 Texas Instruments Incorporated
Product Folder Links: LP2992



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