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数据搜索系统，热门电子元器件搜索 |
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数据搜索系统，热门电子元器件搜索 |
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HCF4013B 数据表(PDF) 5 Page - STMicroelectronics |
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HCF4013B 数据表(HTML) 5 Page - STMicroelectronics |
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5 / 12 page  TEST CIRCUITS Quiescent Device Current. Noise Immunity. Input Leakage Current. DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb =25°C, CL = 50pF, RL = 200kΩ, typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall times = 20ns) Val ue Symbol Parameter Test Conditions V DD (V) Min. Typ. Max. Unit t PL H,tPHL Propagation Delay Time 5 125 250 ns 10 60 120 15 45 90 t THL,tTLH Transition Time 5 100 200 ns 10 50 100 15 40 80 HCC/HCF4011B/12B/23B 5/12 |
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