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STTH8L06FP 数据表(PDF) 4 Page - STMicroelectronics |
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STTH8L06FP 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 11 page ![]() Characteristics STTH8L06 4/11 Doc ID 8373 Rev 6 Figure 7. Reverse recovery charges versus dIF/dt (typical values) Figure 8. Softness factor versus dIF/dt (typical values) 0 100 200 300 400 500 600 700 800 900 1000 0 20 40 60 80 100 120 140 160 180 200 Q (nC) rr I =2 x I F F(AV) I=I F F(AV) I =0.5 x I F F(AV) V =400V T =125°C R j dI /dt(A/µs) F 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 0 25 50 75 100 125 150 175 200 S factor I 2 x I T =125°C F F(AV) j ≤ V =400V R dI /dt(A/µs) F Figure 9. Relative variations of dynamic parameters versus junction temperature Figure 10. Transient peak forward voltage versus dIF/dt (typical values) 0.00 0.25 0.50 0.75 1.00 1.25 25 50 75 100 125 IRM QRR S factor T (°C) j I 2 x I Reference: T =125°C F F(AV) j ≤ V =400V R 0 1 2 3 4 5 6 7 0 20 40 60 80 100 120 140 160 180 200 V (V) FP dI /dt(A/µs) F I=I T =125°C F F(AV) j Figure 11. Forward recovery time versus dIF/dt (typical values) Figure 12. Junction capacitance versus reverse voltage applied (typical values) 0 50 100 150 200 250 300 0 20 40 60 80 100 120 140 160 180 200 t (ns) fr dI /dt(A/µs) F I=I T =125°C F F(AV) j V =1.1 x V max. FR F 1 10 100 1000 1 10 100 1000 C(pF) V (V) R F=1MHz V =30mV T =25°C OSC RMS j |
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