Absolute Maximum Ratings (Note 1)

Supply Voltage

+12V to −0.2V

Output Voltage

(+V

Output Current

10 mA

Input Current at any pin (Note 2)

5 mA

Storage Temperature

−65˚C to +150˚C

Junction Temperature, max

(T

+125˚C

ESD Susceptibility (Note 3) :

Human Body Model

2500V

Machine Model

250V

Operating Ratings(Note 1)

Specified Temperature Range:

T

MIN

≤ T

A

≤ T

MAX

LM62B, LM62C

0˚C

≤ T

A

≤ +90˚C

Supply Voltage Range (+V

+2.7V to +10V

Thermal Resistance,

θ

JA(Note 5)

450˚C/W

Soldering process must comply with National Semiconduc-

tor’s Reflow Temperature Profile specifications. Refer to

www.national.com/packaging. (Note 4)

Electrical Characteristics

Unless otherwise noted, these specifications apply for +V

other limits T

Parameter

Conditions

Typical

(Note 6)

LM62B

LM62C

Units

(Limit)

Limits

Limits

(Note 7)

(Note 7)

Accuracy (Note 8)

˚C (max)

+2.5/−2.0

+4.0/−3.0

˚C (max)

Output Voltage at 0˚C

+480

mV

Nonlinearity (Note 9)

˚C (max)

Sensor Gain

+16

+16.1

+16.3

mV/˚C (max)

(Average Slope)

+15.1

+14.9

mV/˚C (min)

Output Impedance

+3.0V

≤ +V

S

≤ +10V

4.7

4.7

k

Ω (max)

0˚C

≤ T

A

≤ +75˚C, +V

4.4

4.4

k

Ω (max)

Line Regulation (Note 10)

+3.0V

≤ +V

S

≤ +10V

mV/V (max)

+2.7V

≤ +V

S

≤ +3.3V, 0˚C ≤ T

A

≤ +75˚C

mV (max)

Quiescent Current

+2.7V

≤ +V

S

≤ +10V

82

130

130

µA (max)

165

165

µA (max)

Change of Quiescent Current

+2.7V

≤ +V

S

≤ +10V

Temperature Coefficient of

0.2

µA/˚C

Quiescent Current

Long Term Stability (Note 11)

T

for 1000 hours

˚C

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed

specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test

conditions.

Note 3: The human body model is a 100 pF capacitor discharged through a 1.5 k

Ω resistor into each pin. The machine model is a 200 pF capacitor discharged

directly into each pin.

Note 4: Reflow temperature profiles are different for lead-free and non-lead-free packages.

Note 5: The junction to ambient thermal resistance (

Note 7: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).

Note 8: Accuracy is defined as the error between the output voltage and +15.6 mV/˚C times the device’s case temperature plus 480 mV, at specified conditions of

voltage, current, and temperature (expressed in ˚C).

Note 9: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature

range.

Note 10: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be

computed by multiplying the internal dissipation by the thermal resistance.

Note 11: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46

hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The

majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.

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