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L6326 数据表(PDF) 1 Page - STMicroelectronics |
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L6326 数据表(HTML) 1 Page - STMicroelectronics |
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1 / 4 page ![]() 1/4 L6326 February 2001 This is preliminary information on a new product now in development. Details are subject to change without notice. s Power Supplies +5Vdc, +8Vdc s Current bias or voltage bias (selectable) / Voltage sense architecture s Single ended read input s 24 pin TSSOP package, two channels s External Resistor for read and write currents or trimmed internal resistor available (serial port selectable) s Read channel -3dB bandwidth > 300MHz (Rmr=60 ohms, no interconnect) s Input equivalent preamplifier voltage noise 0.5nV/rtHz typ s Input equivalent MR bias current noise 10pA/rtHz typ s MR bias current programmable (5 bit DAC) 1.8- 8mA (GMR range), 3.8-10mA (AMR range) s MR bias voltage programmable (5 bit DAC) 100- 460mV (GMR range), 220-580mV (AMR range) s Programmable gain (100V and 150V) s Write frequency up to 250MHz (Lh=90nH,R=15 ohms, Ch=2pF, VDD=8V) s Rise/Fall time <0.7ns (Iw =40mA 0-pk, Lh=90nH, Rh=15 ohms, Ch=2pF, VDD=8V) s Write current programmable (5 bit DAC) 15-60mA s Overshoot control 3 bit resolution (+1 bit for range) s Bi-directional 16-bit TTLs Serial interface for head selection, read/write currents selection, chip parameters modification, chip enable, vendor code and fault status read back registers s 2-wire mode selection (R/W, MRR) s Bank write feature for servo write s Digital buffered head voltage DBHV / Analog buffered head voltage ABHV pin (gain 5) s Thermal asperity detection with adjustable sensitivity level (6 bit DAC) s Thermal asperity correction s Read head open/short detection s Low supply detect and temperature monitoring (high temperature warning and Analog Temperature s Diode Voltage measurement) s Low write frequency detection s WRITE to READ fast recovery 250ns (same head, including 150ns blanking period) s GMR Low-Bias in WRITE mode with fast recovery to READ mode bias (250ns) s Head-to-head switch in READ mode - 10 µs (typ) s Head and MR bias current switching transient current head protection s READ-to-WRITE switching 30ns (same head) s Programmable read bias during write and bank write operation s ESD diodes for GMR protections s Differential Write Driver to minimize coupling to GMR element DESCRIPTION The L6326 is a two channel BICMOS monolithic inte- grated circuit GMR pre-amplifier designed for use with four-terminal magneto-resistive (AMR and GMR heads) read/inductive write heads. The device con- sists of a voltage sense current bias or voltage bias (selectable), single ended input/ true differential out- put (RDX, RDY), low-noise high bandwidth read am- plifier and includes fast current switching write drivers which support data rates up to 500 Mb/s with 90nH write heads. The GMR pre-amplifier provides programmable read current/voltage bias and write current (5 bit DACs), fault detection circuitry and servo writing features. Read amplifier gain, write current wave shape (over- shoot and damping) can be adjusted and a thermal asperity detection and correction circuit can be en- abled and programmed with different thresholds (6 bit DAC) through a 16-bit bi-directional serial inter- face (SDEN, SDATA, SCLK). The device operates from a +5V supply and a +8V supply (typical) for the write drivers. No external components are required if the internal trimmed resistor for reference current setting is selected. TSSOP24 ORDERING NUMBER: L6326 PRODUCT PREVIEW 2 CHANNEL VOLTAGE SENSE AMR/GMR PREAMPLIFIERS |
类似零件编号 - L6326 |
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类似说明 - L6326 |
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