Symbol

Test conditions

Max

Unit

2V

(note 1)

10/700

µs

1.2/50

µs

2/10

µs

1kV

1.5kV

2.5kV

Ω

Ω

Ω

5

10

20

V

note 1 : see test circuit for VFP,RP is the protection resistor located on the line card

°C)

Symbol

Test conditions

Max

Unit

5

µA

C

F = 1MHz

200

100

pF

°C)

Symbol

Test conditions

Min

Max

Unit

5mA

150

mA

2.5

V

5

µA

10/700

µs

1.2/50

µs

2/10

µs

1kV

1.5kV

2.5kV

Ω

Ω

Ω

7

15

20

V

note 2 : see functional holding current test circuit

note 3 : See test circuit for VDGL

The oscillations with a time duration lower than 50ns are not taken into account

°C)

0.01

0.10

1.00

10.00

100.00

1000.00

0

1

2

3

4

5

6

7

t(s)

ITSM(A)

F=50Hz

Tj initial=25

°C

Fig. 1: Surge peakcurrent versus overloadduration.

-40

-20

0

20

40

60

80

100

120

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

Tj(

°C)

IH[Tj] / IH[Tj=25

°C]

Fig. 2: Relative variation of holding current versus

junction temperature.

LCDP1511D

3/6