LCP3121 datasheet(4/6 Pages) STMICROELECTRONICS

部件名	LCP3121

功能描述	OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE

PDF	6 Pages

Scroll/Zoom	100%

制造商	STMICROELECTRONICS [STMicroelectronics]

网页	http://www.st.com

标志

4 / 6 page

LCP3121

4/6

FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST

0.01

0.10

100

1000

ITSM (A)

t(s)

F=50Hz

Tj initial = 25°c

Fig.

Maximum

non

repetitive

surge

peak-on-state current versus overload duration.

-40

-20

100

120

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

Tj(°C)

IH [Tj] / IH [Tj=25°C]

Fig. 2: Relative variation of holding current versus

junction temperature (typical values).

This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.

TEST PROCEDURE :

- Adjust the current level at the IH value by short circuiting the D.U.T.

- Fire the D.U.T. with a surge current : IPP = 10A, 10/1000

µs.

- The D.U.T. will come back to the off-state within a duration of 50ms max.

Surge

generator

= -48 V

BAT

-VP

D.U.T

LCP3121 数据表(PDF) 4 Page - STMicroelectronics

LCP3121 数据表(HTML) 4 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6

数据表下载