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CSDM65295X 数据表(PDF) 2 Page - Texas Instruments

部件名 CSDM65295X
功能描述  CSDM65295x Dual-Phase Buck Smart Power Stage Module
PDF  5 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

CSDM65295X 数据表(HTML) 2 Page - Texas Instruments

  CSDM65295X Datasheet HTML 1Page - Texas Instruments CSDM65295X Datasheet HTML 2Page - Texas Instruments CSDM65295X Datasheet HTML 3Page - Texas Instruments CSDM65295X Datasheet HTML 4Page - Texas Instruments CSDM65295X Datasheet HTML 5Page - Texas Instruments  
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4 Device and Documentation Support
4.1 Device Support
4.1.1 Third-Party Products Disclaimer
TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT
CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES
OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER
ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.
4.2 Documentation Support
4.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Notifications to register and receive a weekly digest of any product information that has changed. For change
details, review the revision history included in any revised document.
4.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
4.5 Trademarks
TI E2E™ are trademarks of Texas Instruments.
All trademarks are the property of their respective owners.
4.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
4.7 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
5 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
DATE
REVISION
NOTES
February 2026
*
Initial Release
CSDM65295, CSDM65295T
SLVSK71 – FEBRUARY 2026
www.ti.com
2
Submit Document Feedback
Copyright © 2026 Texas Instruments Incorporated
Product Folder Links: CSDM65295 CSDM65295T



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