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M27C1001

2. Sampled only, not 100% tested.

Symbol

Parameter

Test Condition

Min

Max

Unit

Input Leakage Current

±10

µA

Supply Current

50

mA

Program Current

50

mA

Input Low Voltage

–0.3

0.8

V

Input High Voltage

2

V

Output Low Voltage

0.4

V

Output High Voltage TTL

2.4

V

A9 Voltage

11.5

12.5

V

Symbol

Alt

Parameter

Test Condition

Min

Max

Unit

Address Valid to Program Low

2

µs

Input Valid to Program Low

2

µs

2µs

2µs

Chip Enable Low to Program Low

2

µs

Program Pulse Width

95

105

µs

Program High to Input Transition

2

µs

Input Transition to Output Enable Low

2

µs

Output Enable Low to Output Valid

100

ns

(2)

Output Enable High to Output Hi-Z

0

130

ns

Output Enable High to Address

Transition

0ns

Programming

When delivered (and after each erasure for UV

EPROM), all bits of the M27C1001 are in the '1'

state. Data is introduced by selectively program-

ming '0's into the desired bit locations. Although

only '0's will be programmed, both '1's and '0's can

be present in the data word. The only way to

change a '0' to a '1' is by die exposition to ultravio-

let light (UV EPROM). The M27C1001 is in the

programmed is applied to 8 bits in parallel to the

data output pins. The levels required for the ad-

be 6.25V ± 0.25V.