Symbol

Parameter

Test Condition

Min

Max

Unit

Input Capacitance

6

pF

Output Capacitance

12

pF

Note: 1. Sampled only, not 100% tested.

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

Input Leakage Current

0V

10

µA

Output Leakage Current

0V

10

µA

(1)

Supply Current (TTL inputs)

30

mA

Supply Current (CMOS inputs)

25

mA

(1)

Supply Current (Standby) TTL

1mA

(1)

Supply Current (Standby) CMOS

100

µA

Input Low Voltage

– 0.3

0.8

V

Input High Voltage

2

V

Output Low Voltage

0.4

V

Output High Voltage

µA

2.4

V

Note: 1. All I/O’s open circuit.

Symbol

Parameter

Min

Max

Unit

Time Delay to Read Operation

1

µs

≥ 4.5V)

10

ms

Write Inhibit Threshold

3.0

4.2

V

Note: 1. Sampled only, not 100% tested.

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

0.4V to 2.4V

Input and Output Timing Ref. Voltages

0.8V to 2.0V

Note that Output Hi-Z is defined as the point where data is no

longer driven.

Table 4. AC Measurement Conditions

AI00826

2.4V

0.4V

2.0V

0.8V

Figure 7. AC Testing Input Output Waveforms

AI01129

1.3V

OUT

CL = 30pF

CL includes JIG capacitance

3.3k

Ω

1N914

DEVICE

UNDER

TEST

Figure 8. AC Testing Equivalent Load Circuit

6/18

M28C16