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CRCW04020000F0EE 数据表(PDF) 9 Page - Vishay Siliconix |
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CRCW04020000F0EE 数据表(HTML) 9 Page - Vishay Siliconix |
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9 / 13 page ![]() D/CRCW e3 www.vishay.com Vishay Revision: 14-Apr-2026 9 Document Number: 20035 For technical questions, contact: thickfilmchip@vishay.com THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 10.3 - Climatic sequence: - ± (1 % R + 0.05 Ω)± (2 % R + 0.1 Ω) 10.3.4.2 2 (Bb) Dry heat 125 °C; 16 h 10.3.4.3 30 (Db) Damp heat, cyclic 55 °C; ≥ 90 % RH; 24 h; 1 cycle 10.3.4.4 1 (Ab) Cold -55 °C; 2 h 10.3.4.5 13 (M) Low air pressure 8.5 kPa; 2 h; (25 ± 10) °C; 55 °C; > 90 % RH 10.3.4.6 30 (Db) Damp heat, cyclic 5 days; 5 cycles 10.3.4.7 - DC load Standard operation mode U = ≤ Umax.; 1 min - 1 (Ab) Cold -55 °C; 2 h ± (0.25 % R + 0.05 Ω) ± (0.5 % R + 0.05 Ω) 10.1 14 (Na) Rapid change of temperature 30 min at -55 °C; and 30 min at 125 °C; 1000 cycles ± (1 % R + 0.05 Ω) no visible damage 8.1 - Short-term overload U = 2.5 x ≤ 2 x Umax.; whichever is the less severe; 5 s ± (2 % R + 0.05 Ω) 8.2 - Single pulse high voltage overload, 10 μs/700 μs Severity no. 4: U = 10 x ≤ 2 x Umax.; whichever is the less severe; 10 pulses 10 μs/700 μs ± (1 % R + 0.05 Ω) no visible damage Single pulse high voltage overload, 10 μs/700 μs Extended operation mode Severity no. 4: U = 10 x ≤ 2 x Umax.; whichever is the less severe; 10 pulses 10 μs/700 μs ± (2 % R + 0.1 Ω) no visible damage 8.4 - Periodic electric overload U = or ≤ 2 x Umax.; whichever is the less severe; 0.1 s on; 2.5 s off; 1000 cycles ± (1 % R + 0.05 Ω) no visible damage Periodic electric overload Extended operation mode U = or ≤ 2 x Umax.; whichever is the less severe; 0.1 s on; 2.5 s off; 1000 cycles ± (2 % R + 0.1 Ω) no visible damage 8.5 - Electrostatic discharge (human body model) IEC 61340-3-1 (1); 3 pos. + 3 neg. discharges; ESD voltage acc. to the size: D10/CRCW0402 e3: 400 V D11/CRCW0603 e3: 800 V D12/CRCW0805 e3: 1000 V D25/CRCW1206 e3: 2000 V CRCW1210 e3 to CRCW2512 e3: ≥ 2000 V ± (1 % R + 0.05 Ω) TEST PROCEDURES AND REQUIREMENTS EN 60115-1 CLAUSE IEC 60068-2 TEST METHOD TEST PROCEDURE REQUIREMENTS PERMISSIBLE CHANGE ( ΔR) (1) STABILITY CLASS 1 OR BETTER STABILITY CLASS 2 OR BETTER Stability for product types: D10/CRCW0402 e3 to CRCW2512 e3 D/CRCW e3 1 Ω to 10 MΩ P 70 x R P 70 x R P 70 x R P 70 x R 15 x P 70 x R 15 x P 70 x R |
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