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MP2321 数据表(PDF) 4 Page - Monolithic Power Systems |
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MP2321 数据表(HTML) 4 Page - Monolithic Power Systems |
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4 / 24 page ![]() MP2321 – 19V, 2A, LOW IQ, STEP-DOWN CONVERTER MP2321 Rev. 1.1 www.MonolithicPower.com 4 5/24/2019 MPS Proprietary Information. Patent Protected. Unauthorized Photocopy and Duplication Prohibited. © 2019 MPS. All Rights Reserved. ELECTRICAL CHARACTERISTICS VIN = 12V, TJ = -40°C to +125°C (7), typical value is tested at TJ = +25°C, unless otherwise noted. Parameters Symbol Condition Min Typ Max Units Supply current (shutdown) IIN VEN = 0V 0.1 1 μA Supply current (quiescent) IQ VEN = 5V, VFB = 0.7V, TJ = 25°C 40 55 μA VIN under-voltage lockout threshold rising INUVVth 3.5 3.7 3.9 V VIN under-voltage lockout threshold hysteresis INUVHYS 200 mV HS switch on resistance HSRDS(ON) 110 mΩ LS switch on resistance LSRDS(ON) 40 mΩ Switch leakage SWLKG VEN = 0V, VSW = 0V or 12V 0 1 μA High-side MOSFET current limit ILIMIT Duty = 40%, TJ = -40°C to +125°C 2.7 4 6 A Duty = 40%, TJ = 25°C 3 4 6 Low-Side MOSFET current limit ILIMIT PWM mode, sink current 1.5 A One-shot on timer (8) TON RREQ = 180k from FREQ/MODE to GND 230 ns Minimum on time (8) TON_min 90 ns Minimum off time TOFF_min 150 ns Feedback voltage VFB TJ = -40°C to +125°C 591 600 609 mV TJ = 25°C 594 600 606 Feedback current IFB VFB = 700mV 10 50 nA Soft-start current ISS 4 8 11 μA EN input high voltage 1.6 V EN input low voltage 0.4 V EN input current IEN VEN = 2V 2 μA VEN = 0V 0 Power good UV rising threshold PGUVVth_Hi 0.9 VFB Power good UV falling threshold PGUVVth_Lo 0.85 VFB Power good OV rising threshold PGOVVth_Hi 1.2 1.3 1.4 VFB Power good OV falling threshold PGOVVth_Lo 1 1.1 1.2 VFB Power good delay PGTd 140 μs Power good sink current capability VPG Sink 1mA 0.4 V Power good leakage current IPG_LEAK VPG = 3.3V 50 nA Thermal shutdown (8) TSD 150 °C Thermal shutdown hysteresis (8) TSD_HYS 20 °C NOTES: 7) Not tested in production. Guaranteed by over-temperature correlation. 8) Not tested in production. Guaranteed by design and engineering sample characterization test. |
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