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AP150P01NF 数据表(PDF) 2 Page - A POWER MICROELECTRONICS |
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AP150P01NF 数据表(HTML) 2 Page - A POWER MICROELECTRONICS |
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2 / 7 page ![]() AP150P01NF -18V P-Channel Enhancement Mode MOSFET AP150P01NF REV1.0 永源微电子科技有限公司 Electrical Characteristics (TJ=25 ℃, unless otherwise noted) Symbol Parameter Test Condition Min Type Max Units VDS Drain-source breakdown voltage VGS=0V, ID = -250μA -12 -18 - V VGS(th) Gate-source threshold voltage VDS=VGS, ID=-250μA -0.5 -0.75 -1.4 V IGSS Gate-source leakage VDS=0V, VGS=±12V - - ± 100 nA IDSS Zero gate voltage drain current VDS=-12V, VGS=0V - - -1 μA RDS(on) Drain-source on-state resistance VGS=-4.5V, ID=-20A - 1.7 2.2 RDS(on) Drain-source on-state resistance VGS=-2.5V, ID=-15A - 2.7 3.2 gfs Forward transconductance a VDS=-10V, ID=-25A - 120 - S Ciss Input capacitance VDS=-10V, VGS=0V, f=1MHz - 22000 - pF Coss Output capacitance - 2470 - pF Crss Reverse transfer capacitance - 2515 - pF Qg Total gate charge VDS=-10V, VGS=-4.5V, ID =-20A - 202.5 nC Qgs Gate-source charge - 32.5 - nC Qgd Gate-drain charge - 51.5 - nC Rg Gate resistance f=1MHz 0.8 1.5 2.5 Ω td(on) Turn-on delay time VDD=-10V, RL=1Ω ID=-10A,VGEN=-10V, Rg=1Ω - 20 40 ns tr Rise time - 14 28 ns td(on) Turn-on delay time VDD=-10V, RL=1Ω,ID=-10 A, VGEN=-4.5V, Rg=1Ω - 115 200 ns td(off) Turn-off delay time - 230 390 ns IS Continuous source-drain diode current TC = 25 °C - - -150 A ISM Pulse diode forward current - - -450 VSD Body diode voltage IS = -5 A, VGS = 0 V - -0.64 -1.1 V trr Body diode reverse recovery time IF=-10A, di/dt=100A/μs, TJ =25°C - 88 140 ns Qrr Body diode reverse recovery charge - 120 200 nC Note : 1、The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper. 2、The data tested by pulsed , pulse width ≦ 300us , duty cycle ≦ 2% 3、The EAS data shows Max. rating . The test condition is VDD=-16V,VGS=-4.5V,L=0.1mH,IAS=-50A 4、The power dissipation is limited by 150℃ junction temperature 5、The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation. |
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