M29W400T datasheet(13/34 Pages) STMICROELECTRONICS

13 / 34 page

Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance

VIN =0V

COUT

Output Capacitance

VOUT =0V

Note: 1. Sampled only, not 100% tested.

Table 12. Capacitance (1) (TA =25

°C, f = 1 MHz )

AI01417

1.5V

Figure 4. AC Testing Input Output Waveform

AI01968

0.8V

OUT

CL = 30pF or 100pF

CL includes JIG capacitance

3.3k

Ω

1N914

DEVICE

UNDER

TEST

Figure 5. AC Testing Load Circuit

Input Rise and Fall Times

≤ 10ns

Input Pulse Voltages

0 to 3V

Input and Output Timing Ref. Voltages

1.5V

Table 11. AC Measurement Conditions

Symbol

Parameter

Test Condition

Min

Max

Unit

ILI

Input Leakage Current

≤ VIN ≤ VCC

±1

µA

ILO

Output Leakage Current

≤ VOUT ≤ VCC

±1

µA

ICC1

Supply Current (Read) Byte

E = VIL,G = VIH, f = 6MHz

ICC1

Supply Current (Read) Word

E = VIL,G = VIH, f = 6MHz

ICC3

Supply Current (Standby)

E = VCC

± 0.2V

µA

ICC4

(1)

Supply Current (Program or Erase)

Byte program, Block or

Chip Erase in progress

VIL

Input Low Voltage

–0.5

0.8

VIH

Input High Voltage

0.7 VCC

VCC + 0.3

VOL

Output Low Voltage

IOL = 4mA

0.45

VOH

Output High Voltage CMOS

IOH = –100

µAVCC –0.4V

VID

A9 Voltage (Electronic Signature)

11.0

12.0

IID

A9 Current (Electronic Signature)

A9 = VID

100

µA

VLKO

Supply Voltage (Erase and

Program lock-out)

2.0

2.3

Note: 1. Sampled only, not 100% tested.

Table 13. DC Characteristics

(TA = 0 to 70

°C, –20 to 85°C or –40 to 85°C; VCC = 2.7V to 3.6V)

13/34

M29W400T, M29W400B

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