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HCF40107B 数据表(PDF) 4 Page - STMicroelectronics

部件名 HCF40107B
功能描述  DUAL 2-INPUT NAND BUFFER/DRIVER
PDF  11 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

HCF40107B 数据表(HTML) 4 Page - STMicroelectronics

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HCF40107B
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DC SPECIFICATIONS
The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
** Measured with external pull-up resistor, RL = 10kΩ to VDD.
*** Forced output disabled.
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
(*) RL is external pull-up resistor to VDD.
Symbol
Parameter
Test Condition
Value
Unit
VI
(V)
VO
(V)
|IO|
(
µA)
VDD
(V)
TA = 25°C
-40 to 85°C
-55 to 125°C
Min.
Typ.
Max.
Min.
Max.
Min.
Max.
IL
Quiescent Current
0/5
5
0.02
5
150
30
µA
0/10
10
0.02
10
300
60
0/15
15
0.02
20
600
120
0/20
20
0.04
100
3000
600
VIH**
High Level Input
Voltage
0.5/4.5
<1
5
3.5
3.5
3.5
V
1/9
<1
10
7
7
7
1.5/13.5
<1
15
11
11
11
VIL**
Low Level Input
Voltage
4.5/0.5
<1
5
1.5
1.5
1.5
V
9/1
<1
10
3
3
3
13.5/1.5
<1
15
4
4
4
IOL
Output Sink
Current
5
0.4
5
21
32
16
12
mA
51
5
44
68
30
25
10
0.5
10
49
74
37
28
10
1
10
89
136
68
51
15
0.5
15
66
100
50
38
IOH
Output Drive
Current
No Internal Pull-up Device
mA
IIH, IIL
Input Leakage
Current
0/18
Any Input
18
±10-5 ±0.1
±0.1
±1
µA
IOH, IOL
***
3-State Output
Leakage Current
0/18
18
18
±10-4
22
20
µA
CI
Input Capacitance
Any Input
5
7.5
pF
CO
Output
Capacitance
Any Output
30
pF
Symbol
Parameter
Test Condition
Value (*)
Unit
VDD (V)
Min.
Typ.
Max.
tPHL tPLH Propagation Delay Time
High to Low
5
RL* = 120Ω
100
200
ns
10
45
90
15
30
60
Low to High
5
RL* = 120Ω
100
200
ns
10
60
120
15
50
100
tTHL tTLH Transition Time
High to Low
5
RL* = 120Ω
50
100
ns
10
20
40
15
10
20
Low to High
5
RL* = 120Ω
50
100
ns
10
35
70
15
25
50



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