The ST24/25x04 are 4 Kbit electrically erasable

programmable memories (EEPROM), organized

as 2 blocks of 256 x8 bits. They are manufactured

in STMicroelectronics’s Hi-Endurance Advanced

CMOS technology which guarantees an endur-

ance of one million erase/write cycles with a data

retention of 40 years.

Both Plastic Dual-in-Line and Plastic Small Outline

packages are available.

ard, two wire serial interface which uses a bi-direc-

tional data bus and serial clock. The memories

carry a built-in 4 bit, unique device identification

tion. This is used together with 2 chip enable inputs

(E2, E1) so that up to 4 x 4K devices may be

attached to the I

protocol with all memory operations synchronized

by the serial clock. Read and write operations are

initiated by a START condition generated by the

bus master. The START condition is followed by a

stream of 7 bits (identification code 1010), plus one

read/write bit and terminated by an acknowledge

bit.

SDA

VSS

SCL

MODE/WC

E1

PRE

VCC

E2

AI00852E

ST24x04

ST25x04

1

2

3

4

8

7

6

5

Figure 2A. DIP Pin Connections

1

AI01107E

2

3

4

8

7

6

5

SDA

VSS

SCL

MODE/WC

E1

PRE

VCC

E2

ST24x04

ST25x04

Figure 2B. SO Pin Connections

DESCRIPTION (cont’d)

Symbol

Parameter

Value

Unit

Ambient Operating Temperature

–40 to 125

°C

Storage Temperature

–65 to 150

°C

Lead Temperature, Soldering

(SO8 package)

(PSDIP8 package)

40 sec

10 sec

215

260

°C

Input or Output Voltages

–0.6 to 6.5

V

Supply Voltage

–0.3 to 6.5

V

Electrostatic Discharge Voltage (Human Body model)

(2)

4000

V

Electrostatic Discharge Voltage (Machine model)

(3)

500

V

Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"

may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other

conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum

Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other

relevant quality documents.

2. MIL-STD-883C, 3015.7 (100pF, 1500

Ω).

3. EIAJ IC-121 (Condition C) (200pF, 0

Ω).

2/16

ST24/25C04, ST24/25W04