CAT5259

© Catalyst Semiconductor, Inc.

5

Doc. No. MD-2000 Rev. H

Characteristics subject to change without notice

POWER UP TIMING

(1)(2)

Symbol

Parameter

Max

Units

Power-up to Read Operation

1

ms

Power-up to Write Operation

1

ms

XDCP TIMING

Symbol

Parameter

Min

Max

Units

Wiper Response Time After Power Supply Stable

5

10

µs

Wiper Response Time After Instruction Issued

5

10

µs

WRITE CYCLE LIMITS

(3)

Symbol

Parameter

Max

Units

Write Cycle Time

5

ms

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Reference Test Method

Min

Max

Units

(4)

Endurance

MIL-STD-883, Test Method 1033

1,000,000

Cycles/Byte

(4)

Data Retention

MIL-STD-883, Test Method 1008

100

Years

(4)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(4)

Latch-Up

JEDEC Standard 17

100

mA

Figure 1. Bus Timing

Notes:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

(3) The write cycle is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle. During the write

cycle, the bus interface circuits are disabled, SDA is allowed to remain high, and the device does not respond to its slave address.

(4) This parameter is tested initially and after a design or process change that affects the parameter.

tHIGH

SCL

SDA IN

SDAOUT

tLOW

tF

tLOW

tR

tBUF

tSU:STO

tSU:DAT

tHD:DAT

tHD:STA

tSU:STA

tAA

tDH