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T80C5112-RKSIV 数据表(PDF) 93 Page - ATMEL Corporation |
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T80C5112-RKSIV 数据表(HTML) 93 Page - ATMEL Corporation |
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93 / 97 page  Rev. B - November 10, 2000 93 Preliminary T80C5112 18.6.11. External Clock Drive Characteristics (XTAL1) 18.6.12. External Clock Drive Waveforms Figure 45. External Clock Drive Waveforms 18.6.13. A/D comverter Notes: (1)For 10 bits resolution 18.6.14. AC Testing Input/Output Waveforms Figure 46. AC Testing Input/Output Waveforms AC inputs during testing are driven at VCC - 0.5 for a logic Ò1Ó and 0.45V for a logic Ò0Ó. Timing measurement are made at VIH min for a logic Ò1Ó and V IL max for a logic Ò0Ó. Symbol Parameter Min Max Units TCLCL Oscillator Period 25 ns TCHCX High Time 5 ns TCLCX Low Time 5 ns TCLCH Rise Time 5 ns TCHCL Fall Time 5 ns TCHCX/TCLCX Cyclic ratio in X2 mode 40 60 % Symbol Parameter Min Typ Max Units Conversion time 11 Clock periods (1 for sam- pling, 10 for conversion) Fconv_ck Clock Conversion frequency 350 (1) kHz Sampling frequency 8 32 kHz VCC-0.5 V 0.45 V 0.7VCC 0.2VCC-0.1 V TCHCL TCLCX TCLCL TCLCH TCHCX 0.45 V VCC-0.5 V 0.2VCC+0.9 0.2VCC-0.1 INPUT/OUTPUT |
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