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STTH16003 数据表(PDF) 3 Page - STMicroelectronics |
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STTH16003 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 7 page ![]() STTH16003 Characteristics 3/7 Table 5. Recovery characteristics Symbol Parameter Test conditions Min. Typ Max. Unit trr Reverse recovery time Tj = 25 °C IF = 0.5 A, Irr = 0.25 A IR = 1 A 60 ns IF = 1 A, dIF/dt = 50 A/µs, VR = 30 V 80 ns tfr Forward recovery time Tj = 25 °C IF = 80 A dIF/dt = 200 A/µs VFR = 1.1 x VFmax 1000 ns VFP Forward recovery voltage 5 V IRM Reverse recovery current Tj = 125 °C IF = 60 A, dIF/dt = 200 A/µs, Vcc = 200 V 16 A Sfactor 0.3 - Figure 1. Conduction losses versus average current (per diode) Figure 2. Forward voltage drop versus forward current (maximum values, per diode) Figure 3. Relative variation of thermal impedance junction to case versus pulse duration Figure 4. Peak reverse recovery current versus dIF/dt (90% confidence, per diode) 0 10203040 5060708090 100 0 10 20 30 40 50 60 70 80 90 100 P1(W) δ = 0.1 δ = 0.2 δ = 0.5 δ = 1 δ = 0.05 IF(av) (A) T δ=tp/T tp 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 1 10 100 200 IFM(A) Tj=125°C (Typical values) Tj=25°C Tj=125°C VFM(V) 1E-3 1E-2 1E-1 1E+0 5E+0 0.0 0.2 0.4 0.6 0.8 1.0 Zth(j-c)/Rth(j-c) T δ=tp/T tp δ = 0.5 δ = 0.2 δ = 0.1 Single pulse tp(s) 0 50 100 150 200 250 300 350 400 450 500 0 5 10 15 20 25 30 IRM(A) VR=200V Tj=125°C IF=2xIF(av) IF=IF(av) IF=0.5xIF(av) dIF/dt(A/µs) |
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