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STL9NK30Z 数据表(PDF) 3 Page - STMicroelectronics |
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STL9NK30Z 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 8 page ![]() 3/8 STL9NK30Z ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED) ON/OFF DYNAMIC SWITCHING SOURCE DRAIN DIODE Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %. 2. Pulse width limited by safe operating area. 3. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS. Symbol Parameter Test Conditions Min. Typ. Max. Unit V(BR)DSS Drain-source Breakdown Voltage ID =1mA, VGS = 0 300 V IDSS Zero Gate Voltage Drain Current (VGS =0) VDS = Max Rating VDS = Max Rating, TC = 125 °C 1 50 µA µA IGSS Gate-body Leakage Current (VDS =0) VGS = ± 20V ±10 µA VGS(th) Gate Threshold Voltage VDS =VGS,ID = 50µA 3 3.75 4.5 V RDS(on) Static Drain-source On Resistance VGS =10V, ID = 4.5 A 0.36 0.4 Ω Symbol Parameter Test Conditions Min. Typ. Max. Unit gfs (1) Forward Transconductance VDS =10V, ID = 4.5 A 5.4 S Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance VDS = 25V,f= 1MHz,VGS = 0 670 125 28 pF pF pF Coss eq. (3) Equivalent Output Capacitance VGS =0V, VDS = 0V to 440 V 70 pF RG Gate Input Resistance f=1 MHz Gate DC Bias = 0 Test Signal Level = 20mV Open Drain 3.6 Ω Symbol Parameter Test Conditions Min. Typ. Max. Unit td(on) tr td(off) tf Turn-on Delay Time Rise time Turn-off Delay Time Fall Time VDD =150 V, ID = 4.5 A RG = 4.7Ω VGS =10 V (Resistive Load see, Figure 3) 16 20 36 10 ns ns ns ns Qg Qgs Qgd Total Gate Charge Gate-Source Charge Gate-Drain Charge VDD =240V, ID =9 A, VGS =10V 25 5.5 13.4 35 nC nC nC Symbol Parameter Test Conditions Min. Typ. Max. Unit ISD ISDM (2) Source-drain Current Source-drain Current (pulsed) 9 36 A A VSD (1) Forward On Voltage ISD = 9 A, VGS =0 1.6 V trr Qrr IRRM Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current ISD = 9 A, di/dt = 100A/µs VDD =40V, Tj = 150°C (see test circuit, Figure 5) 165 0.9 11.2 ns µC A |
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