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TS1871 数据表(PDF) 7 Page - STMicroelectronics

部件名 TS1871
功能描述  1.8V input/output rail-to-rail low power operational amplifiers
PDF  26 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

TS1871 数据表(HTML) 7 Page - STMicroelectronics

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TS1871-TS1872-TS1874
Electrical characteristics
7/26
Table 5.
Electrical characteristics at VCC = +5V
with VDD = 0V, CL & RL connected to VCC/2, and Tamb = 25°C (unless otherwise specified)
(1)
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
Vio
Input offset voltage
Vicm = Vout = VCC/2
TS1871A/2A/4A
Tmin ≤ Tamb ≤ Tmax
TS1871/2/4
Tmin ≤ Tamb ≤ Tmax
0.1
1
1.5
3
6
mV
ΔVio
Input offset voltage drift
2
µV/°C
Iio
Input offset current
Vicm = Vout = VCC/2
(2)
Tmin ≤ Tamb ≤ Tmax
330
60
nA
Iib
Input bias current
Vicm = Vout = VCC/2
(1)
Tmin ≤ Tamb ≤ Tmax
70
130
150
nA
CMR
Common mode rejection ratio
20 log (
ΔVic/ΔVio)
0
≤ Vicm ≤ VCC, Vout not equal to VCC/2
Tmin ≤ Tamb ≤ Tmax
65
62
85
dB
SVR
Supply voltage rejection ratio
20 log (
ΔVcc/ΔVio)
VCC = 1.8 to 5V
70
90
dB
Avd
Large signal voltage gain
Vout = 1V to 4V
RL = 2kΩ
RL = 600Ω
83
77
92
85
dB
VOH
High level output voltage
Vid = 100mV
RL = 2kΩ
RL = 600Ω
Tmin ≤ Tamb ≤ Tmax, RL = 2kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 600Ω
4.80
4.75
4.80
4.75
4.95
4.90
V
VOL
Low level output voltage
Vid = -100mV
RL = 2kΩ
RL = 600Ω
Tmin ≤ Tamb ≤ Tmax, RL = 2kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 600Ω
88
115
130
188
130
188
mV
Io
Output source current
Vid = 100mV, VO = VDD
20
80
mA
Output sink current
Vid = -100mV, VO = VCC
20
80
ICC
Supply current (per amplifier)
Vout = VCC/2
AVCL = 1, no load
Tmin ≤ Tamb ≤ Tmax
500
835
875
µA
GBP
Gain bandwidth product
RL = 10kΩ, CL = 100pF, f = 100kHz
1
1.8
MHz
SR
Slew rate
RL = 10kΩ, CL = 100pF, AV = 1
0.42
0.6
V/µs
φm
Phase margin
CL = 100pF
55
Degrees
en
Input voltage noise
f = 1kHz
27
nV/
√Hz
THD
Total harmonic distortion
0.01
%
1.
All parameter limits at temperatures different from 25°C are guaranteed by correlation.
2.
Maximum values include unavoidable inaccuracies of the industrial tests.



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