QST108AM0 datasheet(33/51 Pages) STMICROELECTRONICS

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QST108

Electrical characteristics

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6.3.3

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU and DLU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

For more details, refer to the application note AN1181.

Electro-static discharge (ESD)

Electro-Static Discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models

can be simulated: Human Body Model and Charge Device Model. These tests comply with

JESD22-A114A/A115A specifications.

Static and dynamic latch-up

●

LU: 3 complementary static tests are required on 10 parts to assess the latch-up

performance. A supply overvoltage (applied to each power supply pin) and a current

injection (applied to each I/O pin) are performed on each sample. This test complies

with EIA/JESD 78 IC latch-up specifications.

●

DLU: Electro-Static Discharges (one positive then one negative test) are applied to

each pin of 3 samples when the MCU is running to assess the latch-up performance in

Dynamic mode. Power supplies are set to the typical values and the component is put

in Reset mode. This test complies with IEC1000-4-2 and SAEJ1752/3 specifications.

For more details, refer to the application note AN1181.

Table 25.

Absolute maximum ratings

Symbol

Ratings

Conditions

Maximum value (1)

Data based on characterization results, not tested in production.

Unit

VESD(HBM)

Electro-static discharge voltage

(Human Body Model)

TA=+25°C

4000

VESD(CDM)

Electro-static discharge voltage

(Charge Device Model)

TA=+25°C

500

Table 26.

Electrical sensitivities

Symbol

Parameter

Conditions

Class (1)

Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the

JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B

Class strictly covers all the JEDEC criteria (international standard).

Static latch-up class

TA=+125°C

DLU

Dynamic latch-up class

VDD=5.5V, fDEVICE = 4MHz, TA=+25°C

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