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STV0676 数据表(PDF) 18 Page - STMicroelectronics |
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STV0676 数据表(HTML) 18 Page - STMicroelectronics |
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18 / 21 page ![]() Pinout and pin descriptions STV0676 18/21 USB INTERFACE 61 USB_DN BIDIR USB data line 62 USB_DP BIDIR USB data line TEST MODE SELECTION 1 TEST_CONF[0] INPUT Test configuration bit - connect to VDD for normal operation 2 TEST_CONF[1] INPUT Test configuration bit - connect to VDD for normal operation 3 TEST_CONF[2] INPUT Test configuration bit - connect to VDD for normal operation EEPROM INTERFACEa 63 EEPROM_SDA BIDIR Serial data to/from the EEPROM or slave I2C clock 64 EEPROM_SCL BIDIR Serial clock to the EEPROM or slave I2C clock a. The I2C pins EEPROM_SCL and EEPROM_SDA can be reconfigured to act as a low speed I2C slave device that allows the user to directly control the internal register space of the VP and VC modules. Table 10: STV0676 pin description Pin Signal Type Description |
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