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2PD602ASL 数据表(PDF) 4 Page - NXP Semiconductors |
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2PD602ASL 数据表(HTML) 4 Page - NXP Semiconductors |
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4 / 9 page ![]() 2PD602AXL_1 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 01 — 27 October 2008 4 of 9 NXP Semiconductors 2PD602AxL 50 V, 500 mA NPN general-purpose transistors 7. Characteristics [1] Pulse test: tp ≤ 300 µs; δ≤ 0.02. 8. Test information 8.1 Quality information This product has been qualified in accordance with the Automotive Electronics Council (AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in automotive applications. Table 8. Characteristics Tamb =25 °C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit ICBO collector-base cut-off current VCB =60V; IE = 0 A --10 nA VCB =60V; IE =0A; Tj = 150 °C --5 µA IEBO emitter-base cut-off current VEB =4V; IC = 0 A --10 nA hFE DC current gain VCE =10V; IC = 500 mA [1] 40 - - hFE group Q VCE =10V; IC = 150 mA [1] 85 - 170 hFE group R VCE =10V; IC = 150 mA [1] 120 - 240 hFE group S VCE =10V; IC = 150 mA [1] 170 - 340 VCEsat collector-emitter saturation voltage IC = 300 mA; IB =30mA [1] - - 600 mV fT transition frequency VCE =10V; IC = 50 mA; f = 100 MHz [1] hFE group Q 140 - - MHz hFE group R 160 - - MHz hFE group S 180 - - MHz Cc collector capacitance VCB =10V; IE =ie =0A; f=1MHz --15 pF |
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