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VN460SP 数据表(PDF) 3 Page - STMicroelectronics |
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VN460SP 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 9 page ![]() ELECTRICAL TRANSIENTS REQUIREMENTS ISO T/ R 7637/ 1 Test Pu lse T EST LEVEL S I I I I II I V Delays an d I mpedance 1 -25 V -50 V -75 V -100 V 2 ms, 10 Ω 2 +25 V +50 V +75 V +100 V 0.2 ms, 10 Ω 3a -25 V -50 V -100 V -150 V 0.1 µs, 50 Ω 3b +25 V +50 V +75 V +100 V 0.1 µs, 50 Ω 4 -4 V -5 V -6 V -7 V 100 ms, 0.01 Ω 5 +26. 5 +46. 5 +66.5 +86.5 400 ms, 2 Ω ISO T/ R 7637/ 1 Test Pu lse TEST L EVELS RESUL TS I II III I V 1C C C C 2C C C C 3a C C C C 3b C C C C 4C C C C 5C E E E (With a series resistor ≥ 1KΩ in input and status pins). CL ASS CONT ENT S C All function of the device are performed as designed after exposure to disturbance. E One or more funct ions of the device is not perf ormed as designed aft er exposure and cannot be returned to proper operation without replacing the device. VN460SP 3/9 |
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