WS57C191 datasheet(4/7 Pages) STMICROELECTRONICS

4 / 7 page

WS57C191C/291C

2-10

SYMBOL

PARAMETER

CONDITIONS

TYP(5)

MAX

UNITS

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

VOUT = 0V

CVPP

VPP Capacitance

VPP = 0 V

CAPACITANCE(4) T

A = 25 °C, f = 1 MHz

30 pF

(INCLUDING SCOPE

AND JIG

CAPACITANCE)

Ω

2.01 V

D.U.T.

A.C. TESTING INPUT/OUTPUT WAVEFORM

TEST LOAD (High Impedance Test Systems)

3.0

0.0

1.5

TEST

POINTS

NOTE: 6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.

A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended.

Inadequate decoupling may result in access time degradation or other transient performance failures.

NOTES: 4. This parameter is only sampled and is not 100% tested.

5.Typical values are for TA = 25°C and nominal supply voltages.

A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V for a

logic "0." Timing measurements are made at 1.5 V for input and

output transitions in both directions.

WS57C191 数据表(PDF) 4 Page - STMicroelectronics

WS57C191 数据表(HTML) 4 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7

数据表下载