SWAF05 datasheet(9/15 Pages) SEOUL

9 / 15 page

Rev. 1.00

SWAF05

7. Reliability

(1) TEST ITEMS AND RESULTS

TEST ITEM

Test conditions

Note

Number of

Damaged

Reference

Life Test 1

Ta = 25°C; IF = 20 mA

1000 hr

0/20

EIAJ ED-4701

100 101

Thermal Shock

-30°C ~ 85°C

(30 min) (30 min)

20 cycle

0/50

EIAJ ED-4701

300 307

High Temperature Life Test

Ta = 85°C; IF = 5 mA

1000 hr

0/20

Low Temperature Life Test

Ta = - 30°C; IF = 20 mA

1000 hr

0/20

High Temperature Storage

Ta = 100°C

1000 hr

0/50

EIAJ ED-4701

200 201

Low Temperature Storage

Ta = - 40°C

1000 hr

0/50

EIAJ ED-4701

200 202

High Humidity Heat Life Test

Ta = 60°C; RH = 90%, IF = 20 mA

500 hr

0/20

EIAJ ED-4701

100 102

Humidity Heat Load

Ta = 85°C; RH = 85%

1000 hr

0/50

EIAJ ED-4701

100 103

Resistance to Soldering Heat

Tsld = 260°C, 10 sec

Pre treatment; 30°C, 70%, 168 hr

2 time

0/50

EIAJ ED-4701

301 302

Solder ability (Reflow Soldering)

Tsld = 215±5°C, 3 sec

(Lead Solder)

1 time

over 95%

0/50

EIAJ ED-4701

303

Temperature Cycle

- 40°C ~ 25°C ~ 100°C ~ 25°C

(30 min) (5 min) (30 min) (5 min)

100 cycle

0/50

EIAJ ED-4701

100 105

Moisture Resistance Cycle

25°C ~ 65°C ~ - 10°C

RH = 90%, 24 hr / 1 cycle

10 cycle

0/50

EIAJ ED-4701

200 203

(2) CRITERIA FOR JUDGING THE DAMAGE

Criteria for Judgment

Item

Symbol

Test Condition

Min.

Max.

Forward Voltage

IF = 20 mA

U.S.L × 1.2

Reverse Current

VR = 5 V

U.S.L × 2.0

Luminous Intensity

IF = 20 mA

L.S.L × 0.5

SEOUL SEMICONDUCTOR CO., LTD.

SSC-QP-7-03-44(갑)

U.S.L. : Upper Standard Level,

L.S.L. : Lower Standard Level

SWAF05 数据表(PDF) 9 Page - Seoul Semiconductor

SWAF05 数据表(HTML) 9 Page - Seoul Semiconductor

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

数据表下载

链接网址

SWAF05 数据表(PDF) 9 Page - Seoul Semiconductor

SWAF05 数据表(HTML) 9 Page - Seoul Semiconductor

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

数据表 下载

链接网址

数据表下载