SWAF3L datasheet(9/13 Pages) SEOUL

9 / 13 page

Rev. 5.00

SWAF3L

7. Reliability

(1) TEST ITEMS AND RESULTS

TEST ITEM

Test conditions

Note

Number of

Damaged

Reference

Life Test 1

Ta = 25°C; IF = 80 mA

1,000 hr

0/20

EIAJ ED-4701

100 101

High Humidity Heat Life Test

Ta = 60°C; RH = 90%, IF = 60 mA

1,000 hr

EIAJ ED-4701

100 102

Thermal Shock

-30°C ~ 85°C

(30 min) (30 min)

20 cycle

0/50

EIAJ ED-4701

300 307

High Temperature Life Test*1

Ta = 85°C; IF = 60mA

1,000 hr

0/20

Low Temperature Life Test

Ta = - 40°C; IF = 80 mA

1,000 hr

0/20

High Temperature Storage

Ta = 100°C

1,000 hr

0/50

EIAJ ED-4701

200 201

Low Temperature Storage

Ta = - 40°C

1,000 hr

0/50

EIAJ ED-4701

200 202

Humidity Heat Storage

Ta = 60°C; RH = 90%

1,000 hr

0/20

ESD

Human Body Mode : 1 kV

1 time

0/50

MIL-STD

888E

*1 TEST CONDITION : PCB (Material : FR-4, Thickness : 1.6T)

-Operating Condition : RΘ = 140 ºC/W.

(2) CRITERIA FOR JUDGING THE DAMAGE

Criteria for Judgment

Item

Symbol

Test Condition

Min.

Max.

Forward Voltage

IF = 60 mA

U.S.L × 1.2

Reverse Current

VR = 5 V

U.S.L × 2.0

Luminous Intensity

IF = 60 mA

L.S.L × 0.7

U.S.L. : Upper Standard Level,

L.S.L. : Lower Standard Level

SEOUL SEMICONDUCTOR CO., LTD.

SSC-QP-7-03-44(갑)

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