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SWAF09 数据表(PDF) 9 Page - Seoul Semiconductor

部件名 SWAF09
功能描述  WHITE SIDE VIEW LED
PDF  15 Pages
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制造商  SEOUL [Seoul Semiconductor]
网页  http://www.seoulsemicon.com
标志 SEOUL - Seoul Semiconductor

SWAF09 数据表(HTML) 9 Page - Seoul Semiconductor

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Rev. 1.00
SWAF09
Rev. 1.00
7. Reliability
(1) TEST ITEMS AND RESULTS
TEST ITEM
Test conditions
Note
Number of
Damaged
Reference
Life Test 1
Ta = 25°C; IF = 20 mA
1000 hrs.
0/20
EIAJ ED-4701
100 101
Life Test 2
Ta = 25°C; IF = 30 mA
500 hrs.
0/20
EIAJ ED-4701
100 101
Thermal Shock
-30°C ~ 85°C
(30 min) (30 min)
20 cycle
0/50
EIAJ ED-4701
300 307
High Temperature Life Test
Ta = 85°C; IF = 5 mA
1000 hrs.
0/20
-
Low Temperature Life Test
Ta = - 30°C; IF = 20 mA
1000 hrs.
0/20
-
High Temperature Storage
Ta = 100°C
1000 hrs.
0/50
EIAJ ED-4701
200 201
Low Temperature Storage
Ta = - 40°C
1000 hrs.
0/50
EIAJ ED-4701
200 202
High Humidity Heat Life Test*1
Ta = 60°C; RH = 90%, IF = 20 mA
500 hrs.
0/20
EIAJ ED-4701
100 102
Humidity Heat Load
Ta = 85
°C; RH = 85%
1000 hrs.
0/50
EIAJ ED-4701
100 103
Resistance to Soldering Heat
Tsld = 260
°C, 10 sec
Pre treatment; 30°C, 70%, 168 hr
2 times
0/50
EIAJ ED-4701
301 302
Solder ability (Reflow Soldering)
Tsld = 215±5
°C, 3 sec
(Lead Solder)
1 time
over 95%
0/50
EIAJ ED-4701
303
Temperature Cycle
- 40°C ~ 25°C ~ 100°C ~ 25°C
(30 min) (5 min) (30 min) (5 min)
100 cycle
0/50
EIAJ ED-4701
100 105
Moisture Resistance Cycle
25°C ~ 65°C ~ - 10°C
RH = 90%, 24 hr / 1 cycle
10 cycle
0/50
EIAJ ED-4701
200 203
(2) CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgment
Item
Symbol
Test Condition
Min.
Max.
Forward Voltage
VF
IF = 20 mA
-
U.S.L × 1.2
Reverse Current
IR
VR = 5 V
-
U.S.L × 2.0
Luminous Intensity
IV
IF = 20 mA
L.S.L × 0.5
-
U.S.L. : Upper Standard Level,
L.S.L. : Lower Standard Level,
SEOUL SEMICONDUCTOR CO., LTD.
8
SSC-QP-7-03-44(갑)



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