CY74FCT16501T

CY74FCT162501T

CY74FCT162H501T

3

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

−0.7

−1.2

V

Input HIGH Current

Standard

±1

µA

Bus Hold

±100

Input LOW Current

Standard

±1

µA

Bus Hold

±100

µA

−50

µA

+50

µA

Bus Hold Overdrive Current on Bus Hold In-

TBD

mA

High Impedance Output Current

(Three-State Output pins)

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

−80

−140

−200

mA

−50

−180

mA

Power-Off Disable

[12]

±1

µA

Output Drive Characteristics for CY74FCT16501T

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

2.5

3.5

V

2.4

3.5

2.0

3.0

Output LOW Voltage

0.2

0.55

V

Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T

Parameter

Description

Test Conditions

Min.

Max.

Unit

60

115

150

mA

−60

−115

−150

mA

Output HIGH Voltage

2.4

3.3

V

Output LOW Voltage

0.3

0.55

V

Notes:

8.

9.

This parameter is specified but not tested.

10. Pins with bus hold are described in Pin Description.

11. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

12. Tested at +25˚C.