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74FCT162H244CTPVC 数据表(PDF) 3 Page - Texas Instruments

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部件名 74FCT162H244CTPVC
功能描述  16-Bit Buffers/Line Drivers
PDF  8 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

74FCT162H244CTPVC 数据表(HTML) 3 Page - Texas Instruments

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CY74FCT16244T
CY74FCT162244T
CY74FCT162H244T
3
Output Drive Characteristics for CY74FCT16244T
Parameter
Description
Test Conditions
Min.
Typ.[5]
Max.
Unit
VOH
Output HIGH Voltage
VCC=Min., IOH=–3 mA
2.5
3.5
V
VCC=Min., IOH=–15 mA
2.4
3.5
V
VCC=Min., IOH=–32 mA
2.0
3.0
V
VOL
Output LOW Voltage
VCC=Min., IOL=64 mA
0.2
0.55
V
Output Drive Characteristics for CY74FCT162244T, CY74FCT162H244T
Parameter
Description
Test Conditions
Min.
Typ.[5]
Max.
Unit
IODL
Output LOW Current[8]
VCC=5V, VIN=VIH or VIL, VOUT=1.5V
60
115
150
mA
IODH
Output HIGH Current[8]
VCC=5V, VIN=VIH or VIL, VOUT=1.5V
–60
–115
–150
mA
VOH
Output HIGH Voltage
VCC=Min., IOH=–24 mA
2.4
3.3
V
VOL
Output LOW Voltage
VCC=Min., IOL=24 mA
0.3
0.55
V
Notes:
5.
Typical values are at VCC=5.0V, TA = +25˚C ambient.
6.
This parameter is specified but not tested.
7.
Pins with bus hold are described in Pin Description.
8.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
9.
Tested at +25˚C.



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