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CDK1308CILP40 数据表(PDF) 13 Page - Cadeka Microcircuits LLC. |
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CDK1308CILP40 数据表(HTML) 13 Page - Cadeka Microcircuits LLC. |
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13 / 14 page ![]() ©2008 CADEKA Microcircuits LLC www.cadeka.com 13 ADVANCE Data Sheet The quality of the input clock is extremely important for high-speed, high-resolution ADCs. The contribution to SNR from clock jitter with a full scale signal at a given frequency is shown in the equation below: SNRjitter = 20 • log (2 • π • FIN • εt) where FIN is the signal frequency, and εt is the total rms jitter measured in seconds. The rms jitter is the total of all jitter sources including the clock generation circuitry, clock distribution and internal ADC circuitry. For applications where jitter may limit the obtainable per- formance, it is of utmost importance to limit the clock jitter. This can be obtained by using precise and stable clock references (e.g. crystal oscillators with good jitter specifications) and make sure the clock distribution is well controlled. It might be advantageous to use analog power and ground planes to ensure low noise on the sup- plies to all circuitry in the clock distribution. It is of utmost importance to avoid crosstalk between the ADC output bits and the clock and between the analog input signal and the clock since such crosstalk often results in harmonic distortion. The jitter performance is improved with reduced rise and fall times of the input clock. Hence, optimum jitter per- formance is obtained with LVDS or LVPECL clock with fast edges. CMOS and sine wave clock inputs will result in slightly degraded jitter performance. If the clock is generated by other circuitry, it should be re- timed with a low jitter master clock as the last operation before it is applied to the ADC clock input. Digital Outputs Digital output data are presented on parallel CMOS form. The voltage on the OVDD pin set the levels of the CMOS outputs. The output drivers are dimensioned to drive a wide range of loads for OVDD above 2.25V, but it is rec- ommended to minimize the load to ensure as low transient switching currents and resulting noise as possible. In ap- plications with a large fanout or large capacitive loads, it is recommended to add external buffers located close to the ADC chip. The timing is described in the Timing Diagram section. Note that the load or equivalent delay on CK_EXT always should be lower than the load on data outputs to ensure sufficient timing margins. The digital outputs can be set in tristate mode by setting the OE_N signal high. The CDK1308 employs digital offset correction. This means that the output code will be 4096 with shorted inputs. However, small mismatches in parasitics at the input can cause this to alter slightly. The offset correction also results in possible loss of codes at the edges of the full scale range. With no offset correction, the ADC would clip in one end before the other, in practice resulting in code loss at the opposite end. With the output being centered digitally, the output will clip, and the out of range flags will be set, before max code is reached. When out of range flags are set, the code is forced to all ones for over-range and all zeros for under-range. Data Format Selection The output data are presented on offset binary form when DFRMT is low (connect to OVSS). Setting DFRMT high (connect to OVDD) results in 2’s complement output format. Details are shown in Table 1 below. Table 1: Data Format Description for 2Vpp Full Scale Range Differential Input Voltage (IP - IN) Output data: D_9 : D_0 (DFRMT = 0, offset binary) Output Data: D_9 : D_0 (DFRMT = 1, 2’s complement) 1.0 V 11 1111 1111 01 1111 1111 +0.24mV 10 0000 0000 00 0000 0000 -0.24mV 01 1111 1111 11 1111 1111 -1.0V 00 0000 0000 10 0000 0000 |
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