SUPERWORLD ELECTRONICS (S) PTE LTD

SDM109N SERIES

NOTE : Specifications subject to change without notice. Please check our website for latest information.

PG. 4

18.04.2008

PERFORMANCE

Refer to standard electrical characteristics list

should be covered with solder.

More than 90% of the terminal electrode

Preheating

60

seconds

1. Appearance : No significant abnormality

2. Inductance change : Within ±3%

Preheating

60

seconds

No disconnection or short circuit.

2. Inductance : Within ±3% of initial value.

1. Appearance : No damage

No disconnection or short circuit.

2. Inductance : Within ±5% of initial value.

1. Appearance : No damage

Reliability Test

Humidity Resistance

High Temperature

Life Test

Life Test

Low Temperature

Thermal Shock

Solder Heat Resistance

150°C

260°C

150°C

245°C

Inductance

Electrical Characteristics Test

DCR

Heat Rated Current (Irms)

Solderability Test

Mechanical Performance Test

Saturation Current (Isat)

9. RELIABILITY AND TEST CONDITION :

ITEM

Time : 500±12 hours

Applied Current : Rated Curent

Humidity : 90% to 95%

Temperature : 40±5°C

Temperature : 85±5°C

Time : 500±12 hours

Temperature (°C)

Conditions of 1 cycle.

Temperature : -40±5°C

Time : 500±12 hours

Room Temperature

Room Temperature

85±3

-25±3

Recovery: 4 to 24hrs of recovery under the standard

2

Total : 5 cycles

4

3

Step

1

Within 3

Within 3

30±3

Times (min.)

30±3

Preheat : 150°C, 60sec.

Solder : Sn99.95-Cu0.05

Solder Temperature : 260±5°C

Flux : rosin

Dip Time : 10±0.5sec.

10±0.5

seconds

Dipping

cooling

Natural

4±1

seconds

Dipping

cooling

Natural

HP-4192A, HP4284A, CH1320

TEST CONDITION

Isat(A) will cause Lo to drop approximately 25%

Agilent 33420A

Irms(A) will cause an temp rise < 40°C typ.

solder bath at 245±5°C for 5 seconds

After fluxing, component shall be dipped in a melted

condition after the removal from test chamber

condition after the removal from test chamber

Recovery: 4 to 24hrs of recovery under the standard

condition after the removal from test chamber

Recovery: 4 to 24hrs of recovery under the standard

condition after the removal from test chamber

Recovery: 4 to 24hrs of recovery under the standard

MOLDING TYPE DIP INDUCTORS