TC245

786-

× 488-PIXEL CCD IMAGE SENSOR

SOCS019A – DECEMBER 1991

2-11

POST OFFICE BOX 655303

PARAMETER

MIN

TYP†

MAX

UNIT

Dynamic range (see Note 2)

Antiblooming disabled (see Note 3)

60

70

dB

Charge conversion factor

3.8

4

4.2

µV/e

Charge transfer efficiency (see Note 4)

0.99990

0.99995

1

Signal response delay time,

τ (see Note 5 and Figure 13)

18

20

22

ns

Gamma (see Note 6)

0.97

0.98

0.99

Output resistance

700

800

Ω

Noise voltage

1/f noise (5 kHz)

0.1

µV/√Hz

Noise voltage

Random noise (f = 100 kHz)

0.08

µV/√Hz

Noise equivalent signal

30

electrons

ADB (see Note 7)

20

Rejection ratio at 4.77 MHz

SRG1, SRG2, SRG3 (see Note 8)

40

dB

ABG (see Note 9)

20

Supply current

5

mA

IAG

6500

SRG1, SRG2, SRG3

68

Input capacitance, Ci

ABG

2400

pF

TRG

180

SAG

6800

† All typical values are at TA = 25 °C

NOTES:

2. Dynamic range is – 20 times the logarithm of the mean noise signal divided by the saturation output signal.

3. For this test, the antiblooming gate must be biased at the intermediate level.

4. Charge transfer efficiency is one minus the charge loss per transfer in the output register. The test is performed in the dark using

an electrical input signal.

5. Signal-response delay time is the time between the falling edge of the SRG clock pulse and the output signal valid state.

6. Gamma (

γ) is the value of the exponent in the equation below for two points on the linear portion of the transfer function curve (this

value represents points near saturation):

Exposure (2)

Exposure (1)

g

+

Output signal (2)

Output signal (1)

7. ADB rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ADB.

8. SRGn rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at SRGn.

9. ABG rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ABG.